Image contrast enhancement of Ni/YSZ anode during the slice-and-view process in FIB-SEM

Shu Sheng Liu, Akiko Takayama, Syo Matsumura, Michihisa Koyama

Research output: Contribution to journalArticlepeer-review

5 Citations (Scopus)


Focused ion beam-scanning electron microscopy (FIB-SEM) is a widely used and easily operational equipment for three-dimensional reconstruction with flexible analysis volume. It has been using successfully and increasingly in the field of solid oxide fuel cell. However, the phase contrast of the SEM images is indistinct in many cases, which will bring difficulties to the image processing. Herein, the phase contrast of a conventional Ni/yttria stabilized zirconia anode is tuned in an FIB-SEM with In-Lens secondary electron (SE) and backscattered electron detectors. Two accessories, tungsten probe and carbon nozzle, are inserted during the observation. The former has no influence on the contrast. When the carbon nozzle is inserted, best and distinct contrast can be obtained by In-Lens SE detector. This method is novel for contrast enhancement. Phase segmentation of the image can be automatically performed. The related mechanism for different images is discussed.

Original languageEnglish
Pages (from-to)326-332
Number of pages7
JournalJournal of Microscopy
Issue number3
Publication statusPublished - Mar 1 2016

All Science Journal Classification (ASJC) codes

  • Pathology and Forensic Medicine
  • Histology


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