Host emission from BaMgAl10O17 and SrMgAl 10O17 phosphor: Effects of temperature and defect level

Hiroaki Onuma, Hiroaki Tanno, Ai Suzuki, Riadh Sahnoun, Michihisa Koyama, Hideyuki Tsuboi, Nozomu Hatakeyama, Akira Endou, Hiromitsu Takaba, Carlos A. Del Carpio, Momoji Kubo, Ramesh Chandra Deka, Hiroshi Kajiyama, Tsutae Shinoda, Akira Miyamoto

    Research output: Contribution to journalArticlepeer-review

    13 Citations (Scopus)


    Understanding the mechanism of blue-light emission in Eu-doped BAM phosphor as well as its sensitive degradation is required because this is a very important material in fluorescent lamps and plasma-display panels. In this study, both theoretical and experimental investigations on the host emissions in BaMgAl10O17 and SrMgAl10O17 were performed. Host emissions from BaMgAl10O17 and SrMgAl 10O17 by photoluminescence and thermoluminescence spectra were observed. Photoluminescence spectra suggested that the host emission from SrMgAl10O17 was easily quenched by thermal vibrations. The thermoluminescence spectra showed the existence of shallow and deep defect levels in BaMgAl10O17 and SrMgAl10O 17 phosphors. It was shown that SrMgAl10O17 and its conduction plane could undergo degradation during irradiation of vacuum-ultra-violet (VUV) lights based on the calculated energy of formation of an oxygen vacancy. Moreover, the structural defects, such as oxygen vacancies, would cause localizing levels in the upper level in the valence band and in the conduction band. The results suggest the contribution of the host emission to the energy transfer to the Eu atoms would not be significant and the oxygen vacancies would act as the traps for excited carriers.

    Original languageEnglish
    Pages (from-to)211-222
    Number of pages12
    JournalJournal of the Society for Information Display
    Issue number3
    Publication statusPublished - Mar 2010

    All Science Journal Classification (ASJC) codes

    • Electronic, Optical and Magnetic Materials
    • Atomic and Molecular Physics, and Optics
    • Electrical and Electronic Engineering


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