TY - GEN
T1 - Holonomic Approach for Item Response Theory Parameter Estimation
AU - Noguchi, Kazuhisa
AU - Ito, Eisuke
N1 - Publisher Copyright:
© 2018 IEEE.
PY - 2018/7/2
Y1 - 2018/7/2
N2 - The IRT (item response theory) is a theory for scoring of tests, and it is used for some test systems such as TOEFL. Classical test scoring is the total of raw scores for each items (questions). On the other hand, IRT can make fine performance finer than the raw score method. IRT is based on the relationship between individual test takers' performances on a test item (question), and the test takers' levels of performance. Even with the same number of correct answers, the IRT score may be different depending on the degree of difficulty of item (question). Computational complexity of parameter estimation of IRT is one of important issue. To solve this issue, we propose a parameter estimation method of IRT using the Holonomic approach. Generate differential equations which solve the likelihood function of IRT. By solving this differential equation, it is able to estimate the ability parameter.
AB - The IRT (item response theory) is a theory for scoring of tests, and it is used for some test systems such as TOEFL. Classical test scoring is the total of raw scores for each items (questions). On the other hand, IRT can make fine performance finer than the raw score method. IRT is based on the relationship between individual test takers' performances on a test item (question), and the test takers' levels of performance. Even with the same number of correct answers, the IRT score may be different depending on the degree of difficulty of item (question). Computational complexity of parameter estimation of IRT is one of important issue. To solve this issue, we propose a parameter estimation method of IRT using the Holonomic approach. Generate differential equations which solve the likelihood function of IRT. By solving this differential equation, it is able to estimate the ability parameter.
UR - http://www.scopus.com/inward/record.url?scp=85065172527&partnerID=8YFLogxK
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U2 - 10.1109/IIAI-AAI.2018.00068
DO - 10.1109/IIAI-AAI.2018.00068
M3 - Conference contribution
AN - SCOPUS:85065172527
T3 - Proceedings - 2018 7th International Congress on Advanced Applied Informatics, IIAI-AAI 2018
SP - 322
EP - 325
BT - Proceedings - 2018 7th International Congress on Advanced Applied Informatics, IIAI-AAI 2018
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 7th International Congress on Advanced Applied Informatics, IIAI-AAI 2018
Y2 - 8 July 2018 through 13 July 2018
ER -