High tc de squid utilizing bicrystal junctions with 30 degree misorientation angle

K. Enpukn; T. Minotani; F. Sbiraishi; A. Kandori; S. Kawakami

doi:10.1109/77.783687

High t_c de squid utilizing bicrystal junctions with 30 degree misorientation angle

K. Enpukn, T. Minotani, F. Sbiraishi, A. Kandori, S. Kawakami

Superconductive Systems Engineering Laboratory

Research output: Contribution to journal › Article › peer-review

10 Citations (Scopus)

Abstract

Performances of high Tc dc SQUID utilizing bicrystal junctions with 30° misorientation angle have been studied. Junction resistance R,=10 Q and critical current /=10-20 uA can be obtained rather easily at 7=77 K with this technology. As a result, voltage modulation depth as high as 50 |iV, and flux noise as low as 5 /Hz2 are obtained for the lOOpH-SQUlD. The measured values of the voltage modulation depth agree reasonably well with the numerical simulation, while the measured values of the flux noise are about 2 or 3 times larger than the simulation. The reason for the high noise level is discussed by taking into account imperfection of junctions.

Original language	English
Pages (from-to)	3109-3112
Number of pages	4
Journal	IEEE Transactions on Applied Superconductivity
Volume	9
Issue number	2 PART 3
DOIs	https://doi.org/10.1109/77.783687
Publication status	Published - 1999

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Electrical and Electronic Engineering

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abstract = "Performances of high Tc dc SQUID utilizing bicrystal junctions with 30° misorientation angle have been studied. Junction resistance R,=10 Q and critical current /=10-20 uA can be obtained rather easily at 7=77 K with this technology. As a result, voltage modulation depth as high as 50 |iV, and flux noise as low as 5 /Hz2 are obtained for the lOOpH-SQUlD. The measured values of the voltage modulation depth agree reasonably well with the numerical simulation, while the measured values of the flux noise are about 2 or 3 times larger than the simulation. The reason for the high noise level is discussed by taking into account imperfection of junctions.",

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T1 - High tc de squid utilizing bicrystal junctions with 30 degree misorientation angle

AU - Enpukn, K.

AU - Minotani, T.

AU - Sbiraishi, F.

AU - Kandori, A.

AU - Kawakami, S.

PY - 1999

Y1 - 1999

N2 - Performances of high Tc dc SQUID utilizing bicrystal junctions with 30° misorientation angle have been studied. Junction resistance R,=10 Q and critical current /=10-20 uA can be obtained rather easily at 7=77 K with this technology. As a result, voltage modulation depth as high as 50 |iV, and flux noise as low as 5 /Hz2 are obtained for the lOOpH-SQUlD. The measured values of the voltage modulation depth agree reasonably well with the numerical simulation, while the measured values of the flux noise are about 2 or 3 times larger than the simulation. The reason for the high noise level is discussed by taking into account imperfection of junctions.

AB - Performances of high Tc dc SQUID utilizing bicrystal junctions with 30° misorientation angle have been studied. Junction resistance R,=10 Q and critical current /=10-20 uA can be obtained rather easily at 7=77 K with this technology. As a result, voltage modulation depth as high as 50 |iV, and flux noise as low as 5 /Hz2 are obtained for the lOOpH-SQUlD. The measured values of the voltage modulation depth agree reasonably well with the numerical simulation, while the measured values of the flux noise are about 2 or 3 times larger than the simulation. The reason for the high noise level is discussed by taking into account imperfection of junctions.

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High t_c de squid utilizing bicrystal junctions with 30 degree misorientation angle

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