High resolution electron microscopy characterization of (La0.5Sr0.5)2CoC4 thin film cathode materials

F. Yang, Y. Chen, Z. Cai, N. Tsvetkov, M. Burriel, H. Tellez, B. Yildiz, J. A. Kilner, D. B. Williams, D. W. McComb

    Research output: Contribution to journalConference articlepeer-review

    Original languageEnglish
    Pages (from-to)1912-1913
    Number of pages2
    JournalMicroscopy and Microanalysis
    Issue number3
    Publication statusPublished - Aug 1 2014
    EventMicroscopy and Microanalysis 2014, M and M 2014 - Hartford, United States
    Duration: Aug 3 2014Aug 7 2014

    All Science Journal Classification (ASJC) codes

    • Instrumentation

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