TY - GEN
T1 - GRT
T2 - 30th IEEE/ACM International Conference on Automated Software Engineering, ASE 2015
AU - Ma, Lei
AU - Artho, Cyrille
AU - Zhang, Cheng
AU - Sato, Hiroyuki
AU - Gmeiner, Johannes
AU - Ramler, Rudolf
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2016/1/4
Y1 - 2016/1/4
N2 - We propose Guided Random Testing (GRT), which uses static and dynamic analysis to include information on program types, data, and dependencies in various stages of automated test generation. Static analysis extracts knowledge from the system under test. Test coverage is further improved through state fuzzing and continuous coverage analysis. We evaluated GRT on 32 real-world projects and found that GRT outperforms major peer techniques in terms of code coverage (by 13 %) and mutation score (by 9 %). On the four studied benchmarks of Defects4J, which contain 224 real faults, GRT also shows better fault detection capability than peer techniques, finding 147 faults (66 %). Furthermore, in an in-depth evaluation on the latest versions of ten popular real-world projects, GRT successfully detects over 20 unknown defects that were confirmed by developers.
AB - We propose Guided Random Testing (GRT), which uses static and dynamic analysis to include information on program types, data, and dependencies in various stages of automated test generation. Static analysis extracts knowledge from the system under test. Test coverage is further improved through state fuzzing and continuous coverage analysis. We evaluated GRT on 32 real-world projects and found that GRT outperforms major peer techniques in terms of code coverage (by 13 %) and mutation score (by 9 %). On the four studied benchmarks of Defects4J, which contain 224 real faults, GRT also shows better fault detection capability than peer techniques, finding 147 faults (66 %). Furthermore, in an in-depth evaluation on the latest versions of ten popular real-world projects, GRT successfully detects over 20 unknown defects that were confirmed by developers.
UR - http://www.scopus.com/inward/record.url?scp=84963829080&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84963829080&partnerID=8YFLogxK
U2 - 10.1109/ASE.2015.49
DO - 10.1109/ASE.2015.49
M3 - Conference contribution
AN - SCOPUS:84963829080
T3 - Proceedings - 2015 30th IEEE/ACM International Conference on Automated Software Engineering, ASE 2015
SP - 212
EP - 223
BT - Proceedings - 2015 30th IEEE/ACM International Conference on Automated Software Engineering, ASE 2015
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 9 November 2015 through 13 November 2015
ER -