TY - GEN
T1 - GRT at the SBST 2015 Tool Competition
AU - Ma, Lei
AU - Artho, Cyrille
AU - Zhang, Cheng
AU - Sato, Hiroyuki
AU - Hagiya, Masami
AU - Tanabe, Yoshinori
AU - Yamamoto, Mitsuharu
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2015/7/30
Y1 - 2015/7/30
N2 - GRT (Guided Random Testing) is an automatic test generation tool for Java code, which leverages static and dynamic program analysis to guide run-time test generation. In this paper, we summarize competition results and experiences of GRT in participating in SBST 2015, where GRT ranked first with a score of 203.73 points over 63 Java classes from 10 packages of 9 open-source software projects.
AB - GRT (Guided Random Testing) is an automatic test generation tool for Java code, which leverages static and dynamic program analysis to guide run-time test generation. In this paper, we summarize competition results and experiences of GRT in participating in SBST 2015, where GRT ranked first with a score of 203.73 points over 63 Java classes from 10 packages of 9 open-source software projects.
UR - http://www.scopus.com/inward/record.url?scp=84946905642&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84946905642&partnerID=8YFLogxK
U2 - 10.1109/SBST.2015.19
DO - 10.1109/SBST.2015.19
M3 - Conference contribution
AN - SCOPUS:84946905642
T3 - Proceedings - 8th International Workshop on Search-Based Software Testing, SBST 2015
SP - 48
EP - 51
BT - Proceedings - 8th International Workshop on Search-Based Software Testing, SBST 2015
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 8th International Workshop on Search-Based Software Testing, SBST 2015
Y2 - 18 May 2015 through 19 May 2015
ER -