TY - JOUR
T1 - Growth process and microstructure of Y123 film fabricated by advanced TFA-MOD process
AU - Minei, T.
AU - Tanaka, T.
AU - Ogata, M.
AU - Mori, N.
AU - Yamada, K.
AU - Mukaida, M.
N1 - Funding Information:
This work was supported in part by the New Energy and Industrial Technology Development Organization (NEDO) as Collaborative Research and Development of Fundamental Technologies for Superconductivity Applications. The authors would like to thank R. Teranishi, H. Fuji, Y. Aoki, T. Izumi and Y. Shiohara (SRL) for the cooperation in the study.
PY - 2006/10/1
Y1 - 2006/10/1
N2 - The advanced metal organic deposition (MOD) process using F-free salt of Cu and trifluroacetates (TFA) salts (Superconductivity Research Laboratory (SRL)-Method) was applied to form well oriented Y123 film on LaAlO3 substrate. In order to clarify the growth mechanism of the Y123 film by the advanced TFA-MOD process, two methods were introduced. One was the quenching method to get samples under several different conditions during the process, and the microstructures were observed by transmission electron microscopy (TEM). The other was in situ observation method to know surface changes of the film by the generation of liquid and/or gas. From the θ-2θ X-ray diffraction (XRD) analysis of YBa2Cu3O7-δ (YBCO) films fabricated by suitable conditions, (0 0 n) diffraction peaks were obtained indicating they had strongly c-axis oriented structure. The thin YBCO films had critical current density (JC) of 3.8-4.9 MA/cm2 (77 K,0 T) measured by the four-probe-method. A growth model with some process-controlling parameters was proposed based on the above observed results.
AB - The advanced metal organic deposition (MOD) process using F-free salt of Cu and trifluroacetates (TFA) salts (Superconductivity Research Laboratory (SRL)-Method) was applied to form well oriented Y123 film on LaAlO3 substrate. In order to clarify the growth mechanism of the Y123 film by the advanced TFA-MOD process, two methods were introduced. One was the quenching method to get samples under several different conditions during the process, and the microstructures were observed by transmission electron microscopy (TEM). The other was in situ observation method to know surface changes of the film by the generation of liquid and/or gas. From the θ-2θ X-ray diffraction (XRD) analysis of YBa2Cu3O7-δ (YBCO) films fabricated by suitable conditions, (0 0 n) diffraction peaks were obtained indicating they had strongly c-axis oriented structure. The thin YBCO films had critical current density (JC) of 3.8-4.9 MA/cm2 (77 K,0 T) measured by the four-probe-method. A growth model with some process-controlling parameters was proposed based on the above observed results.
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U2 - 10.1016/j.physc.2006.04.050
DO - 10.1016/j.physc.2006.04.050
M3 - Article
AN - SCOPUS:33748625441
SN - 0921-4534
VL - 445-448
SP - 570
EP - 573
JO - Physica C: Superconductivity and its applications
JF - Physica C: Superconductivity and its applications
IS - 1-2
ER -