TY - GEN
T1 - Formation of SiO2 thin films on polycrystalline silicon thin films from polysilazane solution by CO2 laser annealing
AU - Hishitani, Daisuke
AU - Horita, Masahiro
AU - Ishikawa, Yasuaki
AU - Watanabe, Yosuke
AU - Ikenoue, Hiroshi
AU - Uraoka, Yukiharu
N1 - Publisher Copyright:
© 2013 ITE and SID.
PY - 2013
Y1 - 2013
N2 - We investigated the formation of SiO2 thin films on polycrystalline silicon thin films by CO2 laser irradiation of perhydropolysilazane. We succeeded in the formation of SiO2 containing few OH groups and having uniform composition in the thickness direction. We considered the effect of CO2 laser irradiation was related to bond vibration.
AB - We investigated the formation of SiO2 thin films on polycrystalline silicon thin films by CO2 laser irradiation of perhydropolysilazane. We succeeded in the formation of SiO2 containing few OH groups and having uniform composition in the thickness direction. We considered the effect of CO2 laser irradiation was related to bond vibration.
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M3 - Conference contribution
AN - SCOPUS:85026260346
T3 - Proceedings of the International Display Workshops
SP - 419
EP - 422
BT - 20th International Display Workshops 2013, IDW 2013
PB - International Display Workshops
T2 - 20th International Display Workshops 2013, IDW 2013
Y2 - 3 December 2013 through 6 December 2013
ER -