TY - GEN
T1 - Formation of nanocrystalline Si by Au-catalyzed CH3SiH3 pulse jet CVD
AU - Abe, Toshiaki
AU - Anan, Shouhei
AU - Watanabe, Fumiya
AU - Takahashi, Ryoji
AU - Ikoma, Yoshifumi
N1 - Copyright:
Copyright 2020 Elsevier B.V., All rights reserved.
PY - 2013
Y1 - 2013
N2 - Au-catalyzed growth of nanocrystalline Si by pulse jet chemical vapor deposition hasbeen investigated. Au thin film was first deposited on thermally oxidized Si(100), then CH3SiH3pulse jets were irradiated onto the Au/SiO2/Si(100) surface. The irradiation of the CH3SiH3 jets at1150 °C resulted in circular patterns with a diameter of ~40 μm on the sample surfaces. In thecenter of the circular patterns, agglomerations of Au were observed. It was found that the oxidelayer was etched and that nanocrystalline Si with diameters ~500 nm was formed in the circularpatterns. These results indicate that the nanocrystalline Si was grown by the VLS process in whichSi atoms were supplied from the oxide layer, Si substrate, and CH3SiH3 molecules.
AB - Au-catalyzed growth of nanocrystalline Si by pulse jet chemical vapor deposition hasbeen investigated. Au thin film was first deposited on thermally oxidized Si(100), then CH3SiH3pulse jets were irradiated onto the Au/SiO2/Si(100) surface. The irradiation of the CH3SiH3 jets at1150 °C resulted in circular patterns with a diameter of ~40 μm on the sample surfaces. In thecenter of the circular patterns, agglomerations of Au were observed. It was found that the oxidelayer was etched and that nanocrystalline Si with diameters ~500 nm was formed in the circularpatterns. These results indicate that the nanocrystalline Si was grown by the VLS process in whichSi atoms were supplied from the oxide layer, Si substrate, and CH3SiH3 molecules.
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U2 - 10.4028/www.scientific.net/MSF.750.244
DO - 10.4028/www.scientific.net/MSF.750.244
M3 - Conference contribution
AN - SCOPUS:84875859381
SN - 9783037856604
T3 - Materials Science Forum
SP - 244
EP - 247
BT - Advanced Materials Science and Technology
PB - Trans Tech Publications Ltd
T2 - 8th International Forum on Advanced Materials Science and Technology, IFAMST 2012
Y2 - 1 August 2012 through 4 August 2012
ER -