TY - GEN
T1 - Finding top-N chance patterns with KeyGraph®-based importance
AU - Okubo, Yoshiaki
AU - Haraguchi, Makoto
AU - Hirokawa, Sachio
PY - 2011
Y1 - 2011
N2 - In this paper, as our first proposal, we discuss a method for finding a rare pattern, called a chance pattern, which connects a pair of more frequent patterns. Particularly, our chance pattern is defined with a KeyGraph®-based importance of patterns. More concretely speaking, a chance pattern is a pattern C which often appears in a part of documents containing a frequent pattern XL as well as in those containing another pattern XR, that is, confidence values of association rules, XL ⇒ C and X R ⇒ C, are relatively high. It would be expected that such a chance pattern C reveals a hidden and implicit relationships between X L and XR. We design clique-search-based algorithms for finding chance patterns with Top-N confidence values.
AB - In this paper, as our first proposal, we discuss a method for finding a rare pattern, called a chance pattern, which connects a pair of more frequent patterns. Particularly, our chance pattern is defined with a KeyGraph®-based importance of patterns. More concretely speaking, a chance pattern is a pattern C which often appears in a part of documents containing a frequent pattern XL as well as in those containing another pattern XR, that is, confidence values of association rules, XL ⇒ C and X R ⇒ C, are relatively high. It would be expected that such a chance pattern C reveals a hidden and implicit relationships between X L and XR. We design clique-search-based algorithms for finding chance patterns with Top-N confidence values.
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U2 - 10.1007/978-3-642-23863-5_47
DO - 10.1007/978-3-642-23863-5_47
M3 - Conference contribution
AN - SCOPUS:80053145038
SN - 9783642238628
T3 - Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
SP - 457
EP - 468
BT - Knowledge-Based and Intelligent Information and Engineering Systems - 15th International Conference, KES 2011, Proceedings
T2 - 15th International Conference on Knowledge-Based and Intelligent Information and Engineering Systems, KES 2011
Y2 - 12 September 2011 through 14 September 2011
ER -