Field emission characterristics of defect-controlled polyimide tunneling cathode

Akiyoshi Baba; Tomoya Yoshida; Tanemasa Asano

doi:10.1109/IVMC.2003.1223086

Field emission characterristics of defect-controlled polyimide tunneling cathode

Akiyoshi Baba, Tomoya Yoshida, Tanemasa Asano

Center for Japan-Egypt Cooperation in Science and Technology（E-JUST Center）

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	Technical Digest of the 16th International Vacuum Microelectronics Conference, IVMC 2003
Editors	Mikio Takai, Junzo Ishikawa, Yasuhito Gotoh
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	267-268
Number of pages	2
ISBN (Electronic)	4818195154, 9784818195158
DOIs	https://doi.org/10.1109/IVMC.2003.1223086
Publication status	Published - Jan 1 2003
Event	16th International Vacuum Microelectronics Conference, IVMC 2003 - Toyonaka, Osaka, Japan Duration: Jul 7 2003 → Jul 11 2003

Publication series

Name	Proceedings of the IEEE International Vacuum Microelectronics Conference, IVMC
Volume	2003-January

Other

Other	16th International Vacuum Microelectronics Conference, IVMC 2003
Country/Territory	Japan
City	Toyonaka, Osaka
Period	7/7/03 → 7/11/03

All Science Journal Classification (ASJC) codes

Electrical and Electronic Engineering
Condensed Matter Physics
Electronic, Optical and Magnetic Materials

Access to Document

10.1109/IVMC.2003.1223086

Cite this

Baba, A., Yoshida, T., & Asano, T. (2003). Field emission characterristics of defect-controlled polyimide tunneling cathode. In M. Takai, J. Ishikawa, & Y. Gotoh (Eds.), Technical Digest of the 16th International Vacuum Microelectronics Conference, IVMC 2003 (pp. 267-268). Article 1223086 (Proceedings of the IEEE International Vacuum Microelectronics Conference, IVMC; Vol. 2003-January). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IVMC.2003.1223086

Field emission characterristics of defect-controlled polyimide tunneling cathode. / Baba, Akiyoshi; Yoshida, Tomoya; Asano, Tanemasa.
Technical Digest of the 16th International Vacuum Microelectronics Conference, IVMC 2003. ed. / Mikio Takai; Junzo Ishikawa; Yasuhito Gotoh. Institute of Electrical and Electronics Engineers Inc., 2003. p. 267-268 1223086 (Proceedings of the IEEE International Vacuum Microelectronics Conference, IVMC; Vol. 2003-January).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Baba, A, Yoshida, T & Asano, T 2003, Field emission characterristics of defect-controlled polyimide tunneling cathode. in M Takai, J Ishikawa & Y Gotoh (eds), Technical Digest of the 16th International Vacuum Microelectronics Conference, IVMC 2003., 1223086, Proceedings of the IEEE International Vacuum Microelectronics Conference, IVMC, vol. 2003-January, Institute of Electrical and Electronics Engineers Inc., pp. 267-268, 16th International Vacuum Microelectronics Conference, IVMC 2003, Toyonaka, Osaka, Japan, 7/7/03. https://doi.org/10.1109/IVMC.2003.1223086

Baba A, Yoshida T, Asano T. Field emission characterristics of defect-controlled polyimide tunneling cathode. In Takai M, Ishikawa J, Gotoh Y, editors, Technical Digest of the 16th International Vacuum Microelectronics Conference, IVMC 2003. Institute of Electrical and Electronics Engineers Inc. 2003. p. 267-268. 1223086. (Proceedings of the IEEE International Vacuum Microelectronics Conference, IVMC). doi: 10.1109/IVMC.2003.1223086

Baba, Akiyoshi ; Yoshida, Tomoya ; Asano, Tanemasa. / Field emission characterristics of defect-controlled polyimide tunneling cathode. Technical Digest of the 16th International Vacuum Microelectronics Conference, IVMC 2003. editor / Mikio Takai ; Junzo Ishikawa ; Yasuhito Gotoh. Institute of Electrical and Electronics Engineers Inc., 2003. pp. 267-268 (Proceedings of the IEEE International Vacuum Microelectronics Conference, IVMC).

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Field emission characterristics of defect-controlled polyimide tunneling cathode

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