Abstract
Three-dimensionally aligned epitaxial (Pb,La)(Zr,Ti)O3/(La,Sr)2CuO4 multilayers were grown on SrTiO3 (100) single crystals by pulse laser deposition. A cube-on-cube epitaxial relationship of these multilayers was confirmed by the θ-2θ diffraction profile and the pole figure. The stability of their interfaces was confirmed by depth profiles and x-ray diffractometry of the as-deposited and the annealed multilayers having 100-300-Å-thick (La,Sr)2CuO4 layers. The results suggest that the multilayers can be applied to the ferroelectric field-effect transistor.
| Original language | English |
|---|---|
| Pages (from-to) | 299 |
| Number of pages | 1 |
| Journal | Applied Physics Letters |
| DOIs | |
| Publication status | Published - 1995 |
| Externally published | Yes |
All Science Journal Classification (ASJC) codes
- Physics and Astronomy (miscellaneous)
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