TY - GEN
T1 - Fast feature extraction approach for multi-dimension feature space problems
AU - Sagheer, Alaa
AU - Tsuruta, Naoyuki
AU - Taniguchi, Rin Ichiro
AU - Arita, Daisaku
AU - Maeda, Sakashi
PY - 2006
Y1 - 2006
N2 - Recently, we proposed a fast feature extraction approach denoted FSOM utilizes Self Organizing Map (SOM). FSOM [1] overcomes the slowness of traditional SOM search algorithm. We investigated the superiority of the new approach using two lip reading data sets which require a limited feature space as the experiments in [1] showed. In this paper, we continue FSOM investigation but using an RGB face recognition database across different poses and different lighting conditions. We believe that such data sets require multi-dimensional feature space to extract the information included in the original data in an effective way especially if you have a big number of classes. Again, we show here how is FSOM reduces the feature extraction time of traditional SOM drastically while preserving same SOM's qualities.
AB - Recently, we proposed a fast feature extraction approach denoted FSOM utilizes Self Organizing Map (SOM). FSOM [1] overcomes the slowness of traditional SOM search algorithm. We investigated the superiority of the new approach using two lip reading data sets which require a limited feature space as the experiments in [1] showed. In this paper, we continue FSOM investigation but using an RGB face recognition database across different poses and different lighting conditions. We believe that such data sets require multi-dimensional feature space to extract the information included in the original data in an effective way especially if you have a big number of classes. Again, we show here how is FSOM reduces the feature extraction time of traditional SOM drastically while preserving same SOM's qualities.
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U2 - 10.1109/ICPR.2006.545
DO - 10.1109/ICPR.2006.545
M3 - Conference contribution
AN - SCOPUS:34147166580
SN - 0769525210
SN - 9780769525211
T3 - Proceedings - International Conference on Pattern Recognition
SP - 417
EP - 420
BT - Proceedings - 18th International Conference on Pattern Recognition, ICPR 2006
T2 - 18th International Conference on Pattern Recognition, ICPR 2006
Y2 - 20 August 2006 through 24 August 2006
ER -