Extremely low bias electron emitter from electric field induced reconstructed tungsten tip

F. H.M.Faridur Rahman; Fouzia Khanom; Seigi Mizuno; Hiroshi Tochihara

doi:10.1109/ICECE.2006.355287

Extremely low bias electron emitter from electric field induced reconstructed tungsten tip

F. H.M.Faridur Rahman, Fouzia Khanom, Seigi Mizuno, Hiroshi Tochihara

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

This report describes a new modification technique of tungsten tip, which results a tip apex capable of emitting electrons at extremely low bias voltages. By employing positive electric field the structure of the tip apex is switched in presence of oxygen followed by freezing out the modified structure at low temperature. Thus modified tip exhibit an extraordinary two orders decrease in applied bias needed for electron emission (from 300V or 210V to as low as 0 to 4V). Electron emission shows good angular confinement with an opening angle of less than 2°.

Original language	English
Title of host publication	Proceedings of 4th International Conference on Electrical and Computer Engineering, ICECE 2006
Publisher	IEEE Computer Society
Pages	48-51
Number of pages	4
ISBN (Print)	9843238141, 9789843238146
DOIs	https://doi.org/10.1109/ICECE.2006.355287
Publication status	Published - Jan 1 2006
Event	4th International Conference on Electrical and Computer Engineering, ICECE 2006 - Dhaka, Bangladesh Duration: Dec 19 2006 → Dec 21 2006

Publication series

Name	Proceedings of 4th International Conference on Electrical and Computer Engineering, ICECE 2006

Other

Other	4th International Conference on Electrical and Computer Engineering, ICECE 2006
Country/Territory	Bangladesh
City	Dhaka
Period	12/19/06 → 12/21/06

All Science Journal Classification (ASJC) codes

Computer Science(all)
Control and Systems Engineering
Electrical and Electronic Engineering

Access to Document

10.1109/ICECE.2006.355287

Cite this

Rahman, F. H. M. F., Khanom, F., Mizuno, S., & Tochihara, H. (2006). Extremely low bias electron emitter from electric field induced reconstructed tungsten tip. In Proceedings of 4th International Conference on Electrical and Computer Engineering, ICECE 2006 (pp. 48-51). Article 4178405 (Proceedings of 4th International Conference on Electrical and Computer Engineering, ICECE 2006). IEEE Computer Society. https://doi.org/10.1109/ICECE.2006.355287

Extremely low bias electron emitter from electric field induced reconstructed tungsten tip. / Rahman, F. H.M.Faridur; Khanom, Fouzia; Mizuno, Seigi et al.
Proceedings of 4th International Conference on Electrical and Computer Engineering, ICECE 2006. IEEE Computer Society, 2006. p. 48-51 4178405 (Proceedings of 4th International Conference on Electrical and Computer Engineering, ICECE 2006).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Rahman, FHMF, Khanom, F, Mizuno, S & Tochihara, H 2006, Extremely low bias electron emitter from electric field induced reconstructed tungsten tip. in Proceedings of 4th International Conference on Electrical and Computer Engineering, ICECE 2006., 4178405, Proceedings of 4th International Conference on Electrical and Computer Engineering, ICECE 2006, IEEE Computer Society, pp. 48-51, 4th International Conference on Electrical and Computer Engineering, ICECE 2006, Dhaka, Bangladesh, 12/19/06. https://doi.org/10.1109/ICECE.2006.355287

Rahman FHMF, Khanom F, Mizuno S, Tochihara H. Extremely low bias electron emitter from electric field induced reconstructed tungsten tip. In Proceedings of 4th International Conference on Electrical and Computer Engineering, ICECE 2006. IEEE Computer Society. 2006. p. 48-51. 4178405. (Proceedings of 4th International Conference on Electrical and Computer Engineering, ICECE 2006). doi: 10.1109/ICECE.2006.355287

Rahman, F. H.M.Faridur ; Khanom, Fouzia ; Mizuno, Seigi et al. / Extremely low bias electron emitter from electric field induced reconstructed tungsten tip. Proceedings of 4th International Conference on Electrical and Computer Engineering, ICECE 2006. IEEE Computer Society, 2006. pp. 48-51 (Proceedings of 4th International Conference on Electrical and Computer Engineering, ICECE 2006).

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Extremely low bias electron emitter from electric field induced reconstructed tungsten tip

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