Original language | English |
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Pages (from-to) | 127-138 |
Number of pages | 12 |
Journal | Memoirs of the Faculty of Engineering, Kyushu University |
Volume | 55 |
Issue number | 2 |
Publication status | Published - Jun 1995 |
Evaluation of Damage Induced by Low-Energy Ion Irradiation in Silicon
Akiyoshi Baba, Taizoh Sadoh, Atsushi[et al] Kenjo
Research output: Contribution to journal › Article › peer-review