Estimation of organic molecular film structures using surface-plasmon resonance spectroscopy

Minniu Zhou; Akira Otomo; Shiyoshi Yokoyama; Shinro Mashiko

doi:10.1016/S0040-6090(01)01114-2

Estimation of organic molecular film structures using surface-plasmon resonance spectroscopy

Minniu Zhou, Akira Otomo, Shiyoshi Yokoyama, Shinro Mashiko

Research output: Contribution to journal › Article › peer-review

12 Citations (Scopus)

Abstract

Near-infrared surface-plasmon resonance (SPR) spectroscopy can be used to determine the thickness of single organic molecular films and the permittivities of organic materials with a high degree of sensitivity. The two-wavelength SPR method with one NIR and one visible light probes was used to improve the accuracy of our experiment. Structures of organic molecules on various substrates were investigated. Particular attention was focused on the error in the measuring of thickness, which was caused by the surface roughness of the substrate. The effect of this was determined by AFM observations. The error in measurement caused by a rough substrate was, thus, estimated.

Original language	English
Pages (from-to)	114-118
Number of pages	5
Journal	Thin Solid Films
Volume	393
Issue number	1-2
DOIs	https://doi.org/10.1016/S0040-6090(01)01114-2
Publication status	Published - Aug 1 2001
Externally published	Yes

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Surfaces and Interfaces
Surfaces, Coatings and Films
Metals and Alloys
Materials Chemistry

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10.1016/S0040-6090(01)01114-2

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abstract = "Near-infrared surface-plasmon resonance (SPR) spectroscopy can be used to determine the thickness of single organic molecular films and the permittivities of organic materials with a high degree of sensitivity. The two-wavelength SPR method with one NIR and one visible light probes was used to improve the accuracy of our experiment. Structures of organic molecules on various substrates were investigated. Particular attention was focused on the error in the measuring of thickness, which was caused by the surface roughness of the substrate. The effect of this was determined by AFM observations. The error in measurement caused by a rough substrate was, thus, estimated.",

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AU - Zhou, Minniu

AU - Otomo, Akira

AU - Yokoyama, Shiyoshi

AU - Mashiko, Shinro

PY - 2001/8/1

Y1 - 2001/8/1

N2 - Near-infrared surface-plasmon resonance (SPR) spectroscopy can be used to determine the thickness of single organic molecular films and the permittivities of organic materials with a high degree of sensitivity. The two-wavelength SPR method with one NIR and one visible light probes was used to improve the accuracy of our experiment. Structures of organic molecules on various substrates were investigated. Particular attention was focused on the error in the measuring of thickness, which was caused by the surface roughness of the substrate. The effect of this was determined by AFM observations. The error in measurement caused by a rough substrate was, thus, estimated.

AB - Near-infrared surface-plasmon resonance (SPR) spectroscopy can be used to determine the thickness of single organic molecular films and the permittivities of organic materials with a high degree of sensitivity. The two-wavelength SPR method with one NIR and one visible light probes was used to improve the accuracy of our experiment. Structures of organic molecules on various substrates were investigated. Particular attention was focused on the error in the measuring of thickness, which was caused by the surface roughness of the substrate. The effect of this was determined by AFM observations. The error in measurement caused by a rough substrate was, thus, estimated.

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JO - Thin Solid Films

JF - Thin Solid Films

IS - 1-2

ER -

Estimation of organic molecular film structures using surface-plasmon resonance spectroscopy

Abstract

All Science Journal Classification (ASJC) codes

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