Abstract
As-grown superconducting YBa2Cu3O7-y thin films with various thicknesses were successfully grown on lattice-matched NdGaO3 substrates by ArF laser ablation deposition. An as-grown 2000-Å-thick film has a zero-resistance temperature (Tc) at 90 K and a 170-Å-thick film has a Tc at 88 K. The existence of a thin interfacial diffusion layer between a 170-Å-thick film and the substrate was observed by Auger electron spectroscopy. Rutherford backscattering spectroscopy suggest that as-grown YBa2Cu3O7-y films on NdGaO3 substrates are high-quality crystals. It is demonstrated that the NdGaO3 has considerable potential as an electronic substrate material by less interfacial diffusion layer and good crystallinity of grown thin films.
Original language | English |
---|---|
Pages (from-to) | 3399-3401 |
Number of pages | 3 |
Journal | Journal of Applied Physics |
Volume | 69 |
Issue number | 5 |
DOIs | |
Publication status | Published - 1991 |
Externally published | Yes |
All Science Journal Classification (ASJC) codes
- Physics and Astronomy(all)