Epitaxial growth of poly(dimethylsilane) evaporated films on poly(tetrafluoroethylene) layer

Reiji Hattori; Yukio Aoki; Takeshi Sugano; Junji Shirafuji; Tsuyoshi Fujiki

doi:10.1143/jjap.36.819

Epitaxial growth of poly(dimethylsilane) evaporated films on poly(tetrafluoroethylene) layer

Reiji Hattori, Yukio Aoki, Takeshi Sugano, Junji Shirafuji, Tsuyoshi Fujiki

Research output: Contribution to journal › Article › peer-review

6 Citations (Scopus)

Abstract

Epitaxially grown poly(dimethylsilane) (PDMS) films have been prepared by evaporation on a highly-oriented poly(tetrafluoroethylene) (PTFE) layer which is formed by means of a mechanical deposition technique. The orientation characteristics of PDMS films are determined using atomic force microscopy, polarizing microscope images, X-ray diffraction patterns and polarized absorption spectra. The oriented regions lie along the grooves (1-5 μm wide) formed on the PTFE layer. The X-ray diffraction patterns and the polarized absorption spectra indicate that the (110) plane of the crystal structure is parallel to the substrate surface and that the c-axis of the Si-backbone chain is parallel to the grooves on the PTFE-coated substrate.

Original language	English
Pages (from-to)	819-823
Number of pages	5
Journal	Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume	36
Issue number	2
DOIs	https://doi.org/10.1143/jjap.36.819
Publication status	Published - 1997
Externally published	Yes

All Science Journal Classification (ASJC) codes

Engineering(all)
Physics and Astronomy(all)

Access to Document

10.1143/jjap.36.819

Cite this

@article{f5f4df2aa89c4c2883ebfc7df7353aab,

title = "Epitaxial growth of poly(dimethylsilane) evaporated films on poly(tetrafluoroethylene) layer",

abstract = "Epitaxially grown poly(dimethylsilane) (PDMS) films have been prepared by evaporation on a highly-oriented poly(tetrafluoroethylene) (PTFE) layer which is formed by means of a mechanical deposition technique. The orientation characteristics of PDMS films are determined using atomic force microscopy, polarizing microscope images, X-ray diffraction patterns and polarized absorption spectra. The oriented regions lie along the grooves (1-5 μm wide) formed on the PTFE layer. The X-ray diffraction patterns and the polarized absorption spectra indicate that the (110) plane of the crystal structure is parallel to the substrate surface and that the c-axis of the Si-backbone chain is parallel to the grooves on the PTFE-coated substrate.",

author = "Reiji Hattori and Yukio Aoki and Takeshi Sugano and Junji Shirafuji and Tsuyoshi Fujiki",

year = "1997",

doi = "10.1143/jjap.36.819",

language = "English",

volume = "36",

pages = "819--823",

journal = "Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers",

issn = "0021-4922",

publisher = "Institute of Physics",

number = "2",

}

TY - JOUR

T1 - Epitaxial growth of poly(dimethylsilane) evaporated films on poly(tetrafluoroethylene) layer

AU - Hattori, Reiji

AU - Aoki, Yukio

AU - Sugano, Takeshi

AU - Shirafuji, Junji

AU - Fujiki, Tsuyoshi

PY - 1997

Y1 - 1997

N2 - Epitaxially grown poly(dimethylsilane) (PDMS) films have been prepared by evaporation on a highly-oriented poly(tetrafluoroethylene) (PTFE) layer which is formed by means of a mechanical deposition technique. The orientation characteristics of PDMS films are determined using atomic force microscopy, polarizing microscope images, X-ray diffraction patterns and polarized absorption spectra. The oriented regions lie along the grooves (1-5 μm wide) formed on the PTFE layer. The X-ray diffraction patterns and the polarized absorption spectra indicate that the (110) plane of the crystal structure is parallel to the substrate surface and that the c-axis of the Si-backbone chain is parallel to the grooves on the PTFE-coated substrate.

AB - Epitaxially grown poly(dimethylsilane) (PDMS) films have been prepared by evaporation on a highly-oriented poly(tetrafluoroethylene) (PTFE) layer which is formed by means of a mechanical deposition technique. The orientation characteristics of PDMS films are determined using atomic force microscopy, polarizing microscope images, X-ray diffraction patterns and polarized absorption spectra. The oriented regions lie along the grooves (1-5 μm wide) formed on the PTFE layer. The X-ray diffraction patterns and the polarized absorption spectra indicate that the (110) plane of the crystal structure is parallel to the substrate surface and that the c-axis of the Si-backbone chain is parallel to the grooves on the PTFE-coated substrate.

UR - http://www.scopus.com/inward/record.url?scp=0031072657&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0031072657&partnerID=8YFLogxK

U2 - 10.1143/jjap.36.819

DO - 10.1143/jjap.36.819

M3 - Article

AN - SCOPUS:0031072657

SN - 0021-4922

VL - 36

SP - 819

EP - 823

JO - Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

JF - Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

IS - 2

ER -

Epitaxial growth of poly(dimethylsilane) evaporated films on poly(tetrafluoroethylene) layer

Abstract

All Science Journal Classification (ASJC) codes

Access to Document

Other files and links

Fingerprint

Cite this