TY - GEN
T1 - Enhanced proton conductivity of amorphous silicate nanofilms
AU - Aoki, Y.
AU - Habazakia, H.
AU - Kunitake, T.
PY - 2009
Y1 - 2009
N2 - AlxSi1-xOn, films exhibit a drastic change of proton conductivity across the film by reducing its thickness to less than 100 nm. The temperature- and humidity-dependence of conductivity of the sub-100 nm films is quite different from those of the thicker films. Furthermore, in the former thickness range, the value of conductivity markedly increases with reducing the film thickness, and its thickness dependence follows a power law with a fixed index of -2.1. This size-scaling effect can be explained by the percolation conductivity model that the probability for percolating of the conductive moiety in AlxSi1-xOn, films increases with decreasing the thickness.
AB - AlxSi1-xOn, films exhibit a drastic change of proton conductivity across the film by reducing its thickness to less than 100 nm. The temperature- and humidity-dependence of conductivity of the sub-100 nm films is quite different from those of the thicker films. Furthermore, in the former thickness range, the value of conductivity markedly increases with reducing the film thickness, and its thickness dependence follows a power law with a fixed index of -2.1. This size-scaling effect can be explained by the percolation conductivity model that the probability for percolating of the conductive moiety in AlxSi1-xOn, films increases with decreasing the thickness.
UR - http://www.scopus.com/inward/record.url?scp=77649210286&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=77649210286&partnerID=8YFLogxK
U2 - 10.1149/1.3242255
DO - 10.1149/1.3242255
M3 - Conference contribution
AN - SCOPUS:77649210286
SN - 9781615676446
T3 - ECS Transactions
SP - 407
EP - 412
BT - ECS Transactions - Solid State Ionic Devices 6 - Nanoionics - 214th ECS Meeting
PB - Electrochemical Society Inc.
T2 - Solid State Ionic Devices 6 - Nanoionics - 214th ECS Meeting
Y2 - 12 October 2008 through 17 October 2008
ER -