Emission characteristics of F- ions into vacuum from CaF2

Takaaki Sakai; Atsushi Kaimai; Takanori Otake; Keiji Yashiro; Tatsuya Kawada; Junichiro Mizusaki; Masateru Nishioka

doi:10.1016/j.ssi.2006.05.014

Emission characteristics of F^- ions into vacuum from CaF₂

Takaaki Sakai, Atsushi Kaimai, Takanori Otake, Keiji Yashiro, Tatsuya Kawada, Junichiro Mizusaki, Masateru Nishioka

Research output: Contribution to journal › Article › peer-review

6 Citations (Scopus)

Abstract

Ion emission characteristics from a fluoride ionic conductor were investigated using CaF₂ single crystals. The emission of F^- ions was confirmed by using a quadrupole mass spectrometer, when a positive electric field was applied to the emission surface of the samples under gas pressure around 10^{- 3} Pa at 1173 K. Mass spectrometry also revealed that the negative ions emitted from CaF₂ contained a certain amount of O^- ions. It can possibly be explained that the surface of CaF₂ was oxidized in the sample preparation. The emission current from CaF₂ also decreased with the passage of time and increased with applied voltage and temperature. The applied voltage dependence of the emission current did not follow the Schottky equation. In Arrhenius plots, two regions with different slopes were observed, suggesting that there are two ion emission mechanisms with different activation energies.

Original language	English
Pages (from-to)	1601-1605
Number of pages	5
Journal	Solid State Ionics
Volume	177
Issue number	19-25 SPEC. ISS.
DOIs	https://doi.org/10.1016/j.ssi.2006.05.014
Publication status	Published - Oct 15 2006
Externally published	Yes

All Science Journal Classification (ASJC) codes

Chemistry(all)
Materials Science(all)
Condensed Matter Physics

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10.1016/j.ssi.2006.05.014

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title = "Emission characteristics of F- ions into vacuum from CaF2",

abstract = "Ion emission characteristics from a fluoride ionic conductor were investigated using CaF2 single crystals. The emission of F- ions was confirmed by using a quadrupole mass spectrometer, when a positive electric field was applied to the emission surface of the samples under gas pressure around 10- 3 Pa at 1173 K. Mass spectrometry also revealed that the negative ions emitted from CaF2 contained a certain amount of O- ions. It can possibly be explained that the surface of CaF2 was oxidized in the sample preparation. The emission current from CaF2 also decreased with the passage of time and increased with applied voltage and temperature. The applied voltage dependence of the emission current did not follow the Schottky equation. In Arrhenius plots, two regions with different slopes were observed, suggesting that there are two ion emission mechanisms with different activation energies.",

author = "Takaaki Sakai and Atsushi Kaimai and Takanori Otake and Keiji Yashiro and Tatsuya Kawada and Junichiro Mizusaki and Masateru Nishioka",

note = "Funding Information: This work was supported by the Grant-in-Aid for Scientific Research on Priority Area, “Nanoionics (439)” by the Ministry of Education, Culture, Sports, Science and Technology (Japan), and a 21st Century COE Program Grant of “The Exploration of the Frontiers of Mechanical Science Based on Nanotechnology” from Ministry of Education, Culture, Sports, Science and Technology (Japan).",

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doi = "10.1016/j.ssi.2006.05.014",

language = "English",

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AU - Sakai, Takaaki

AU - Kaimai, Atsushi

AU - Otake, Takanori

AU - Yashiro, Keiji

AU - Kawada, Tatsuya

AU - Mizusaki, Junichiro

AU - Nishioka, Masateru

N1 - Funding Information: This work was supported by the Grant-in-Aid for Scientific Research on Priority Area, “Nanoionics (439)” by the Ministry of Education, Culture, Sports, Science and Technology (Japan), and a 21st Century COE Program Grant of “The Exploration of the Frontiers of Mechanical Science Based on Nanotechnology” from Ministry of Education, Culture, Sports, Science and Technology (Japan).

PY - 2006/10/15

Y1 - 2006/10/15

N2 - Ion emission characteristics from a fluoride ionic conductor were investigated using CaF2 single crystals. The emission of F- ions was confirmed by using a quadrupole mass spectrometer, when a positive electric field was applied to the emission surface of the samples under gas pressure around 10- 3 Pa at 1173 K. Mass spectrometry also revealed that the negative ions emitted from CaF2 contained a certain amount of O- ions. It can possibly be explained that the surface of CaF2 was oxidized in the sample preparation. The emission current from CaF2 also decreased with the passage of time and increased with applied voltage and temperature. The applied voltage dependence of the emission current did not follow the Schottky equation. In Arrhenius plots, two regions with different slopes were observed, suggesting that there are two ion emission mechanisms with different activation energies.

AB - Ion emission characteristics from a fluoride ionic conductor were investigated using CaF2 single crystals. The emission of F- ions was confirmed by using a quadrupole mass spectrometer, when a positive electric field was applied to the emission surface of the samples under gas pressure around 10- 3 Pa at 1173 K. Mass spectrometry also revealed that the negative ions emitted from CaF2 contained a certain amount of O- ions. It can possibly be explained that the surface of CaF2 was oxidized in the sample preparation. The emission current from CaF2 also decreased with the passage of time and increased with applied voltage and temperature. The applied voltage dependence of the emission current did not follow the Schottky equation. In Arrhenius plots, two regions with different slopes were observed, suggesting that there are two ion emission mechanisms with different activation energies.

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JO - Solid State Ionics

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IS - 19-25 SPEC. ISS.

ER -

Emission characteristics of F^- ions into vacuum from CaF₂

Abstract

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