Abstract
Electron transport of glow-discharged C2H2- and CH4-based SiCx:H films has been studied by time-of-flight method. The electron mobility at room temperature decreases nearly exponentially with increasing carbon content in both C2H2- and CH4-based films. This decrease is mainly due to a broadening of the tail states width in SiCx:H films, as implied from the carbon content dependence of the activation energy of the electron mobility in CH4-based films.
| Original language | English |
|---|---|
| Pages (from-to) | 340-346 |
| Number of pages | 7 |
| Journal | Solar Energy Materials |
| Volume | 23 |
| Issue number | 2-4 |
| DOIs | |
| Publication status | Published - Dec 1 1991 |
| Externally published | Yes |
All Science Journal Classification (ASJC) codes
- General Engineering
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