Electron microscopy investigation of structural transformations in tungsten oxide (WO 3) thin films

C. V. Ramana; S. Utsunomiya; R. C. Ewing; C. M. Julien; U. Becker

doi:10.1002/pssa.200521076

Electron microscopy investigation of structural transformations in tungsten oxide (WO ₃) thin films

C. V. Ramana, S. Utsunomiya, R. C. Ewing, C. M. Julien, U. Becker

Research output: Contribution to journal › Article › peer-review

13 Citations (Scopus)

Abstract

The phase transformations in tungsten oxide (WO ₃) thin films have been investigated in the temperature range of 30-500°C using transmission electron microscopy (TEM) and selected area electron diffraction (SAED) measurements. The results indicate that the phase transitions in WO ₃ thin films occur in sequence exhibiting various crystal phases above room tem perature in the order: monoclinic → orthorhombic → hexagonal. The crystallographic distortions and tilting of the WO ₆ octahedra are responsible for the phase transitions and significantly affect the electronic properties and, hence, the device applications of WO ₃.

Original language	English
Pages (from-to)	R108-R110
Journal	Physica Status Solidi (A) Applications and Materials Science
Volume	202
Issue number	10
DOIs	https://doi.org/10.1002/pssa.200521076
Publication status	Published - Aug 2005
Externally published	Yes

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Surfaces and Interfaces
Surfaces, Coatings and Films
Electrical and Electronic Engineering
Materials Chemistry

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10.1002/pssa.200521076

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title = "Electron microscopy investigation of structural transformations in tungsten oxide (WO 3) thin films",

abstract = "The phase transformations in tungsten oxide (WO 3) thin films have been investigated in the temperature range of 30-500°C using transmission electron microscopy (TEM) and selected area electron diffraction (SAED) measurements. The results indicate that the phase transitions in WO 3 thin films occur in sequence exhibiting various crystal phases above room tem perature in the order: monoclinic → orthorhombic → hexagonal. The crystallographic distortions and tilting of the WO 6 octahedra are responsible for the phase transitions and significantly affect the electronic properties and, hence, the device applications of WO 3.",

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AU - Ramana, C. V.

AU - Utsunomiya, S.

AU - Ewing, R. C.

AU - Julien, C. M.

AU - Becker, U.

PY - 2005/8

Y1 - 2005/8

N2 - The phase transformations in tungsten oxide (WO 3) thin films have been investigated in the temperature range of 30-500°C using transmission electron microscopy (TEM) and selected area electron diffraction (SAED) measurements. The results indicate that the phase transitions in WO 3 thin films occur in sequence exhibiting various crystal phases above room tem perature in the order: monoclinic → orthorhombic → hexagonal. The crystallographic distortions and tilting of the WO 6 octahedra are responsible for the phase transitions and significantly affect the electronic properties and, hence, the device applications of WO 3.

AB - The phase transformations in tungsten oxide (WO 3) thin films have been investigated in the temperature range of 30-500°C using transmission electron microscopy (TEM) and selected area electron diffraction (SAED) measurements. The results indicate that the phase transitions in WO 3 thin films occur in sequence exhibiting various crystal phases above room tem perature in the order: monoclinic → orthorhombic → hexagonal. The crystallographic distortions and tilting of the WO 6 octahedra are responsible for the phase transitions and significantly affect the electronic properties and, hence, the device applications of WO 3.

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Electron microscopy investigation of structural transformations in tungsten oxide (WO ₃) thin films

Abstract

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