Electron detachment spectroscopic study on carbon and silicon cluster anions

Y. Achiba; M. Kohno; M. Ohara; S. Suzuki; H. Shiromaru

doi:10.1016/j.elspec.2004.09.016

Electron detachment spectroscopic study on carbon and silicon cluster anions

Y. Achiba, M. Kohno, M. Ohara, S. Suzuki, H. Shiromaru

Thermal Engineering

Research output: Contribution to journal › Article › peer-review

15 Citations (Scopus)

Abstract

The electron detachment of mass-selected carbon and silicon cluster anions was studied using different ion-source conditions. Ultraviolet photoelectron spectra of medium-sized carbon cluster anions were measured using a laser vaporization source with different fluences. On systematic inspection, the series of spectra showed 4n-periodicity in their electron affinity, which is consistent with the predicted ring-form structure. For silicon cluster anions, resonance-enhanced multiphoton electron detachment spectra were measured. The role of the carrier gases He, N₂ and CO₂ is discussed.

Original language	English
Pages (from-to)	231-240
Number of pages	10
Journal	Journal of Electron Spectroscopy and Related Phenomena
Volume	142
Issue number	3 SPEC. ISS.
DOIs	https://doi.org/10.1016/j.elspec.2004.09.016
Publication status	Published - Mar 2005

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Radiation
Atomic and Molecular Physics, and Optics
Condensed Matter Physics
Spectroscopy
Physical and Theoretical Chemistry

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10.1016/j.elspec.2004.09.016

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abstract = "The electron detachment of mass-selected carbon and silicon cluster anions was studied using different ion-source conditions. Ultraviolet photoelectron spectra of medium-sized carbon cluster anions were measured using a laser vaporization source with different fluences. On systematic inspection, the series of spectra showed 4n-periodicity in their electron affinity, which is consistent with the predicted ring-form structure. For silicon cluster anions, resonance-enhanced multiphoton electron detachment spectra were measured. The role of the carrier gases He, N2 and CO2 is discussed.",

author = "Y. Achiba and M. Kohno and M. Ohara and S. Suzuki and H. Shiromaru",

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AU - Achiba, Y.

AU - Kohno, M.

AU - Ohara, M.

AU - Suzuki, S.

AU - Shiromaru, H.

PY - 2005/3

Y1 - 2005/3

N2 - The electron detachment of mass-selected carbon and silicon cluster anions was studied using different ion-source conditions. Ultraviolet photoelectron spectra of medium-sized carbon cluster anions were measured using a laser vaporization source with different fluences. On systematic inspection, the series of spectra showed 4n-periodicity in their electron affinity, which is consistent with the predicted ring-form structure. For silicon cluster anions, resonance-enhanced multiphoton electron detachment spectra were measured. The role of the carrier gases He, N2 and CO2 is discussed.

AB - The electron detachment of mass-selected carbon and silicon cluster anions was studied using different ion-source conditions. Ultraviolet photoelectron spectra of medium-sized carbon cluster anions were measured using a laser vaporization source with different fluences. On systematic inspection, the series of spectra showed 4n-periodicity in their electron affinity, which is consistent with the predicted ring-form structure. For silicon cluster anions, resonance-enhanced multiphoton electron detachment spectra were measured. The role of the carrier gases He, N2 and CO2 is discussed.

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VL - 142

SP - 231

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JO - Journal of Electron Spectroscopy and Related Phenomena

JF - Journal of Electron Spectroscopy and Related Phenomena

IS - 3 SPEC. ISS.

ER -

Electron detachment spectroscopic study on carbon and silicon cluster anions

Abstract

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