Effects of multi-scale defects on the thermoelectric properties of delafossite CuCr1-xMgxO2 materials

Dung Van Hoang, Anh Tuan Thanh Pham, Hanh Kieu Thi Ta, Truong Huu Nguyen, Ngoc Kim Pham, Lai Thi Hoa, Vinh Cao Tran, Ohtaki Michitaka, Quang Minh Nhat Tran, Jong Ho Park, Jae Ki Lee, Su Dong Park, Tae Seong Ju, Hongjun Park, Sungkyun Park, Thang Bach Phan

Research output: Contribution to journalArticlepeer-review

12 Citations (Scopus)

Abstract

The thermoelectric performance of CuCr1-xMgxO2 materials in terms of multi-scale defects induced at various Mg dopant concentrations (x = 0–0.3) was thoroughly studied in this paper. At 748 K and for x = 0.05, 0.15, and 0.30, we report the following power factors and thermal conductivities: 175, 213, and 2.3 μW/m K2 and 7.85, 5.60, and 3.82 W/m K, respectively. In the low doping regime (x < 0.15), the thermoelectric performance is mainly dependent on hole carriers originated from point defects via Mg substitution on Cr sites, whereas the thermoelectric properties reduce significantly for x ≥ 0.15 due to nanoscale secondary phases (MgCr2O4, Cu2O and CuO) and mesoscale grain boundaries. At 748 K, our CuCr0.85Mg0.15O2 samples exhibit a high figure of merit ZT = 0.028, which is better than those of other CuCr1-xMgxO2 and related delafossite materials. The correlations between the structural and thermoelectric properties of CuCr1-xMgxO2 materials are also discussed in detail.

Original languageEnglish
Article number156119
JournalJournal of Alloys and Compounds
Volume844
DOIs
Publication statusPublished - Dec 5 2020

All Science Journal Classification (ASJC) codes

  • Mechanics of Materials
  • Mechanical Engineering
  • Metals and Alloys
  • Materials Chemistry

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