Abstract
We have first conformed the effects of amplitude modulation (AM) of rf discharge voltage on growth of nano-particles in plasma CVD. This method of AM was used to control fluctuation level of plasma parameters, and allow us to investigate the causal relationship between the nano-particle property and plasma fluctuations. We found the ratio of power of single mode to that harmonic mode is negligible small until fluctuation level of amplitude modulated rf peak-to-peak voltage becomes roughly 20 %. The growth of nano-particles during rf discharge decreased as induced plasma fluctuation level increases.
Original language | English |
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Title of host publication | TENCON 2010 - 2010 IEEE Region 10 Conference |
Pages | 1943-1947 |
Number of pages | 5 |
DOIs | |
Publication status | Published - 2010 |
Event | 2010 IEEE Region 10 Conference, TENCON 2010 - Fukuoka, Japan Duration: Nov 21 2010 → Nov 24 2010 |
Other
Other | 2010 IEEE Region 10 Conference, TENCON 2010 |
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Country/Territory | Japan |
City | Fukuoka |
Period | 11/21/10 → 11/24/10 |
All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering
- Computer Science Applications