Effective IR-drop reduction in at-speed scan testing using distribution-controlling X-identification

Kohei Miyase; Kenji Noda; Hideaki Ito; Kazumi Hatayama; Takashi Aikyo; Yuta Yamato; Hiroshi Furukawa; Xiaoqing Wen; Seiji Kajihara

doi:10.1109/ICCAD.2008.4681551

Effective IR-drop reduction in at-speed scan testing using distribution-controlling X-identification

Kohei Miyase, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Yuta Yamato, Hiroshi Furukawa, Xiaoqing Wen, Seiji Kajihara

Advanced Inormation and Communication Technology

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

27 Citations (Scopus)

Abstract

Test data modification based on test relaxation and X-filling is the preferable approach for reducing excessive IR-drop in at-speed scan testing to avoid test-induced yield loss. However, none of the existing test relaxation methods can control the distribution of identified don't care bits (X-bits), thus adversely affecting the effectiveness of IR-drop reduction. In this paper, we propose a novel test relaxation method, called Distribution-Controlling X-Identification (DC-XID), which controls the distribution of X-bits identified from a set of fully-specified test vectors for the purpose of effectively reducing IR-drop. Experimental results on large industrial circuits demonstrate the effectiveness and practicality of the proposed method in reducing IR-drop, without any impact on fault coverage, test data volume, or test circuit size.

Original language	English
Title of host publication	2008 IEEE/ACM International Conference on Computer-Aided Design Digest of Technical Papers, ICCAD 2008
Pages	52-58
Number of pages	7
DOIs	https://doi.org/10.1109/ICCAD.2008.4681551
Publication status	Published - 2008
Event	2008 International Conference on Computer-Aided Design, ICCAD - San Jose, CA, United States Duration: Nov 10 2008 → Nov 13 2008

Publication series

Name	IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
ISSN (Print)	1092-3152

Other

Other	2008 International Conference on Computer-Aided Design, ICCAD
Country/Territory	United States
City	San Jose, CA
Period	11/10/08 → 11/13/08

All Science Journal Classification (ASJC) codes

Software
Computer Science Applications
Computer Graphics and Computer-Aided Design

Access to Document

10.1109/ICCAD.2008.4681551

Cite this

Miyase, K., Noda, K., Ito, H., Hatayama, K., Aikyo, T., Yamato, Y., Furukawa, H., Wen, X., & Kajihara, S. (2008). Effective IR-drop reduction in at-speed scan testing using distribution-controlling X-identification. In 2008 IEEE/ACM International Conference on Computer-Aided Design Digest of Technical Papers, ICCAD 2008 (pp. 52-58). Article 4681551 (IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD). https://doi.org/10.1109/ICCAD.2008.4681551

Effective IR-drop reduction in at-speed scan testing using distribution-controlling X-identification. / Miyase, Kohei; Noda, Kenji; Ito, Hideaki et al.
2008 IEEE/ACM International Conference on Computer-Aided Design Digest of Technical Papers, ICCAD 2008. 2008. p. 52-58 4681551 (IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Miyase, K, Noda, K, Ito, H, Hatayama, K, Aikyo, T, Yamato, Y, Furukawa, H, Wen, X & Kajihara, S 2008, Effective IR-drop reduction in at-speed scan testing using distribution-controlling X-identification. in 2008 IEEE/ACM International Conference on Computer-Aided Design Digest of Technical Papers, ICCAD 2008., 4681551, IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD, pp. 52-58, 2008 International Conference on Computer-Aided Design, ICCAD, San Jose, CA, United States, 11/10/08. https://doi.org/10.1109/ICCAD.2008.4681551

Miyase K, Noda K, Ito H, Hatayama K, Aikyo T, Yamato Y et al. Effective IR-drop reduction in at-speed scan testing using distribution-controlling X-identification. In 2008 IEEE/ACM International Conference on Computer-Aided Design Digest of Technical Papers, ICCAD 2008. 2008. p. 52-58. 4681551. (IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD). doi: 10.1109/ICCAD.2008.4681551

Miyase, Kohei ; Noda, Kenji ; Ito, Hideaki et al. / Effective IR-drop reduction in at-speed scan testing using distribution-controlling X-identification. 2008 IEEE/ACM International Conference on Computer-Aided Design Digest of Technical Papers, ICCAD 2008. 2008. pp. 52-58 (IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD).

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abstract = "Test data modification based on test relaxation and X-filling is the preferable approach for reducing excessive IR-drop in at-speed scan testing to avoid test-induced yield loss. However, none of the existing test relaxation methods can control the distribution of identified don't care bits (X-bits), thus adversely affecting the effectiveness of IR-drop reduction. In this paper, we propose a novel test relaxation method, called Distribution-Controlling X-Identification (DC-XID), which controls the distribution of X-bits identified from a set of fully-specified test vectors for the purpose of effectively reducing IR-drop. Experimental results on large industrial circuits demonstrate the effectiveness and practicality of the proposed method in reducing IR-drop, without any impact on fault coverage, test data volume, or test circuit size.",

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AU - Wen, Xiaoqing

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Effective IR-drop reduction in at-speed scan testing using distribution-controlling X-identification

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