Effect of the critical current density and the junction size on the leakage current of Nb/Al-AlOx/Nb superconducting tunnel junctions for radiation detection

Koen Joosse; Hiroshi Nakagawa; Hiroshi Akoh; Susumu Takada; Keisuke Maehata; Kenji Ishibashi

doi:10.1143/jjap.35.2633

Effect of the critical current density and the junction size on the leakage current of Nb/Al-AlO_x/Nb superconducting tunnel junctions for radiation detection

Koen Joosse, Hiroshi Nakagawa, Hiroshi Akoh, Susumu Takada, Keisuke Maehata, Kenji Ishibashi

Applied Nuclear Physics

Research output: Contribution to journal › Article › peer-review

12 Citations (Scopus)

Abstract

Nb/Al-AlO_x/Nb superconducting tunnel junctions (STJ's) designed for X-ray detection have been fabricated. The behavior of the low-temperature subgap leakage current, which severely limits the energy resolution obtained in such devices, is investigated. From trends in the dependence of the leakage currents on the critical current density and the size of the STJ, as well as from the low-temperature current-voltage characteristics, and an analysis of the base electrode surface morphology, it is concluded that physical defects in the barrier region are the most probable cause of the leakage currents. Suggestions are given for optimization of the device processing.

Original language	English
Pages (from-to)	2633-2637
Number of pages	5
Journal	Japanese Journal of Applied Physics
Volume	35
Issue number	5 SUPPL. A
DOIs	https://doi.org/10.1143/jjap.35.2633
Publication status	Published - May 1996

All Science Journal Classification (ASJC) codes

Engineering(all)
Physics and Astronomy(all)

Access to Document

10.1143/jjap.35.2633

Cite this

Effect of the critical current density and the junction size on the leakage current of Nb/Al-AlO_x/Nb superconducting tunnel junctions for radiation detection. / Joosse, Koen; Nakagawa, Hiroshi; Akoh, Hiroshi et al.
In: Japanese Journal of Applied Physics, Vol. 35, No. 5 SUPPL. A, 05.1996, p. 2633-2637.

Research output: Contribution to journal › Article › peer-review

@article{3fe2f5de7f164838a93ec8a65ae9ed8b,

title = "Effect of the critical current density and the junction size on the leakage current of Nb/Al-AlOx/Nb superconducting tunnel junctions for radiation detection",

abstract = "Nb/Al-AlOx/Nb superconducting tunnel junctions (STJ's) designed for X-ray detection have been fabricated. The behavior of the low-temperature subgap leakage current, which severely limits the energy resolution obtained in such devices, is investigated. From trends in the dependence of the leakage currents on the critical current density and the size of the STJ, as well as from the low-temperature current-voltage characteristics, and an analysis of the base electrode surface morphology, it is concluded that physical defects in the barrier region are the most probable cause of the leakage currents. Suggestions are given for optimization of the device processing.",

author = "Koen Joosse and Hiroshi Nakagawa and Hiroshi Akoh and Susumu Takada and Keisuke Maehata and Kenji Ishibashi",

year = "1996",

month = may,

doi = "10.1143/jjap.35.2633",

language = "English",

volume = "35",

pages = "2633--2637",

journal = "Japanese Journal of Applied Physics",

issn = "0021-4922",

publisher = "The Japan Society of Applied Physics",

number = "5 SUPPL. A",

}

TY - JOUR

T1 - Effect of the critical current density and the junction size on the leakage current of Nb/Al-AlOx/Nb superconducting tunnel junctions for radiation detection

AU - Joosse, Koen

AU - Nakagawa, Hiroshi

AU - Akoh, Hiroshi

AU - Takada, Susumu

AU - Maehata, Keisuke

AU - Ishibashi, Kenji

PY - 1996/5

Y1 - 1996/5

N2 - Nb/Al-AlOx/Nb superconducting tunnel junctions (STJ's) designed for X-ray detection have been fabricated. The behavior of the low-temperature subgap leakage current, which severely limits the energy resolution obtained in such devices, is investigated. From trends in the dependence of the leakage currents on the critical current density and the size of the STJ, as well as from the low-temperature current-voltage characteristics, and an analysis of the base electrode surface morphology, it is concluded that physical defects in the barrier region are the most probable cause of the leakage currents. Suggestions are given for optimization of the device processing.

AB - Nb/Al-AlOx/Nb superconducting tunnel junctions (STJ's) designed for X-ray detection have been fabricated. The behavior of the low-temperature subgap leakage current, which severely limits the energy resolution obtained in such devices, is investigated. From trends in the dependence of the leakage currents on the critical current density and the size of the STJ, as well as from the low-temperature current-voltage characteristics, and an analysis of the base electrode surface morphology, it is concluded that physical defects in the barrier region are the most probable cause of the leakage currents. Suggestions are given for optimization of the device processing.

UR - http://www.scopus.com/inward/record.url?scp=0030142120&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0030142120&partnerID=8YFLogxK

U2 - 10.1143/jjap.35.2633

DO - 10.1143/jjap.35.2633

M3 - Article

AN - SCOPUS:0030142120

SN - 0021-4922

VL - 35

SP - 2633

EP - 2637

JO - Japanese Journal of Applied Physics

JF - Japanese Journal of Applied Physics

IS - 5 SUPPL. A

ER -

Effect of the critical current density and the junction size on the leakage current of Nb/Al-AlO_x/Nb superconducting tunnel junctions for radiation detection

Abstract

All Science Journal Classification (ASJC) codes

Access to Document

Other files and links

Fingerprint

Cite this