TY - JOUR
T1 - Effect of test patterns on measurement of the luminance of LCD devices by use of a telescopic-type luminance meter.
AU - Morishita, Junji
AU - Dogomori, Kiyoshi
AU - Hatanaka, Shiro
AU - Hiwasa, Takeshi
AU - Nakamura, Yasuhiko
AU - Hashimoto, Noriyuki
AU - Higashida, Yoshiharu
AU - Toyofuku, Fukai
AU - Ohki, Masafumi
N1 - Funding Information:
Acknowledgments The authors thank Shigehisa Ogawa (Eizo Na-nao Corporation, Fukuoka, Japan) for his helpful discussions and Eiji Sato (PSP Corporation, Tokyo, Japan) for providing image-viewing software. We are grateful to Editorial Assistant of this Journal in providing initial polishing of the submitted manuscript in improving the readability and English expressions. This work was supported in part by the Japan Science and Technology Agency, and a Grant-in-Aid for Scientific Research from the Japanese Ministry of Education, Culture, Sports, Science, and Technology (2006–2008).
PY - 2008/1
Y1 - 2008/1
N2 - Quality assurance of electronic display devices is important for maintaining reliable soft-copy image interpretations. This paper presents effects of test patterns on measurement of the luminance of liquid-crystal display (LCD) devices by use of a telescopic-type luminance meter. The luminance for different types of test patterns having different backgrounds and measurement areas was measured and compared with the results obtained with AAPM task group-18 (TG-18) LN test patterns. The luminance measured for the test patterns with a black background was lower than that measured for TG-18 LN test patterns due to the light emitted from the outside the focused area of the telescopic-type luminance meter. Also, the luminance obtained with smaller measurement areas indicated lower luminance. These tendencies were particularly obvious at low luminance. The luminance of the LCD device by use of a telescopic-type luminance meter should be measured with test patterns that have a black background and a smaller measurement area than that for the TG-18 LN test patterns.
AB - Quality assurance of electronic display devices is important for maintaining reliable soft-copy image interpretations. This paper presents effects of test patterns on measurement of the luminance of liquid-crystal display (LCD) devices by use of a telescopic-type luminance meter. The luminance for different types of test patterns having different backgrounds and measurement areas was measured and compared with the results obtained with AAPM task group-18 (TG-18) LN test patterns. The luminance measured for the test patterns with a black background was lower than that measured for TG-18 LN test patterns due to the light emitted from the outside the focused area of the telescopic-type luminance meter. Also, the luminance obtained with smaller measurement areas indicated lower luminance. These tendencies were particularly obvious at low luminance. The luminance of the LCD device by use of a telescopic-type luminance meter should be measured with test patterns that have a black background and a smaller measurement area than that for the TG-18 LN test patterns.
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U2 - 10.1007/s12194-007-0011-0
DO - 10.1007/s12194-007-0011-0
M3 - Article
C2 - 20821169
AN - SCOPUS:68449097928
SN - 1865-0333
VL - 1
SP - 95
EP - 99
JO - Radiological physics and technology
JF - Radiological physics and technology
IS - 1
ER -