TY - GEN
T1 - Effect of Subthreshold Slope on Sensitivity of MOS-HEMT Square Law Detector for THz Waves
AU - Kojima, Hiromu
AU - Kido, Daishi
AU - Kanaya, Haruichi
AU - Ishii, Hiroyuki
AU - Maeda, Tatsuro
AU - Ogura, Mutsuo
AU - Asano, Tanemasa
N1 - Funding Information:
This work was partly supported by JST CREST (No. JPMJCR1431).
Publisher Copyright:
© 2018 IEEE.
PY - 2018/7/2
Y1 - 2018/7/2
N2 - Effects of the subthreshold slope of transistor switching on the sensitivity of the square law detector composed of a high electron mobility transistor (HEMT) to detect terahertz waves have been investigated. Theoretical analysis starting from the unified charge control model of channel carriers has been carried out, which comes down to mathematical formulae suggesting that the subthreshold slope significantly affects the output voltage and the sensitivity of the square law detector. Square law detectors have been fabricated using HEMT with a MOS structured gate on glass substrate to detect 1.0 THz waves. HEMT was composed of InGaAs/InAs/InGaAs double hetero-structured channel. Detection tests using the MOS-HEMT square law detector have clearly shown that the output voltage increases with the subthreshold slope.
AB - Effects of the subthreshold slope of transistor switching on the sensitivity of the square law detector composed of a high electron mobility transistor (HEMT) to detect terahertz waves have been investigated. Theoretical analysis starting from the unified charge control model of channel carriers has been carried out, which comes down to mathematical formulae suggesting that the subthreshold slope significantly affects the output voltage and the sensitivity of the square law detector. Square law detectors have been fabricated using HEMT with a MOS structured gate on glass substrate to detect 1.0 THz waves. HEMT was composed of InGaAs/InAs/InGaAs double hetero-structured channel. Detection tests using the MOS-HEMT square law detector have clearly shown that the output voltage increases with the subthreshold slope.
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U2 - 10.1109/TENCON.2018.8650131
DO - 10.1109/TENCON.2018.8650131
M3 - Conference contribution
AN - SCOPUS:85063237867
T3 - IEEE Region 10 Annual International Conference, Proceedings/TENCON
SP - 1049
EP - 1052
BT - Proceedings of TENCON 2018 - 2018 IEEE Region 10 Conference
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2018 IEEE Region 10 Conference, TENCON 2018
Y2 - 28 October 2018 through 31 October 2018
ER -