Effect of Subthreshold Slope on Sensitivity of MOS-HEMT Square Law Detector for THz Waves

Hiromu Kojima, Daishi Kido, Haruichi Kanaya, Hiroyuki Ishii, Tatsuro Maeda, Mutsuo Ogura, Tanemasa Asano

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Effects of the subthreshold slope of transistor switching on the sensitivity of the square law detector composed of a high electron mobility transistor (HEMT) to detect terahertz waves have been investigated. Theoretical analysis starting from the unified charge control model of channel carriers has been carried out, which comes down to mathematical formulae suggesting that the subthreshold slope significantly affects the output voltage and the sensitivity of the square law detector. Square law detectors have been fabricated using HEMT with a MOS structured gate on glass substrate to detect 1.0 THz waves. HEMT was composed of InGaAs/InAs/InGaAs double hetero-structured channel. Detection tests using the MOS-HEMT square law detector have clearly shown that the output voltage increases with the subthreshold slope.

Original languageEnglish
Title of host publicationProceedings of TENCON 2018 - 2018 IEEE Region 10 Conference
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1049-1052
Number of pages4
ISBN (Electronic)9781538654576
DOIs
Publication statusPublished - Jul 2 2018
Event2018 IEEE Region 10 Conference, TENCON 2018 - Jeju, Korea, Republic of
Duration: Oct 28 2018Oct 31 2018

Publication series

NameIEEE Region 10 Annual International Conference, Proceedings/TENCON
Volume2018-October
ISSN (Print)2159-3442
ISSN (Electronic)2159-3450

Conference

Conference2018 IEEE Region 10 Conference, TENCON 2018
Country/TerritoryKorea, Republic of
CityJeju
Period10/28/1810/31/18

All Science Journal Classification (ASJC) codes

  • Computer Science Applications
  • Electrical and Electronic Engineering

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