Effect of H2S annealing on Ag-rich Ag-In-S thin films prepared by vacuum evaporation

Yoji Akaki; Kyohei Yamashita; Tsuyoshi Yoshitake; Shigeuki Nakamura; Takahiro Tokuda; Kenji Yoshino

doi:10.1143/JJAP.50.05FB06

Effect of H₂S annealing on Ag-rich Ag-In-S thin films prepared by vacuum evaporation

Yoji Akaki, Kyohei Yamashita, Tsuyoshi Yoshitake, Shigeuki Nakamura, Takahiro Tokuda, Kenji Yoshino

Research output: Contribution to journal › Article › peer-review

3 Citations (Scopus)

Abstract

We investigated the effect of H₂S annealing on Ag-In-S thin films prepared by vacuum evaporation. In thin films annealed above 350 °C, diffraction peaks except chalcopyrite AgInS₂ phase were not observed for a starting material ratio of 1.0 but observed for that of 1.2. Thin films annealed at 400 °C with a starting material ratio of 1.5 contained several phases. We found that the Ag/In ratios of the films could be controlled by changing the starting material ratio. Grains of films with composition ratios of 1.0 and 1.2 were nonuniform, whereas those with a composition ratio of 1.5 were uniform.

Original language	English
Article number	05FB06
Journal	Japanese journal of applied physics
Volume	50
Issue number	5 PART 3
DOIs	https://doi.org/10.1143/JJAP.50.05FB06
Publication status	Published - May 2011

All Science Journal Classification (ASJC) codes

Engineering(all)
Physics and Astronomy(all)

Access to Document

10.1143/JJAP.50.05FB06

Cite this

@article{8c3666a56a3c4b188dd2df7a6d929e88,

title = "Effect of H2S annealing on Ag-rich Ag-In-S thin films prepared by vacuum evaporation",

abstract = "We investigated the effect of H2S annealing on Ag-In-S thin films prepared by vacuum evaporation. In thin films annealed above 350 °C, diffraction peaks except chalcopyrite AgInS2 phase were not observed for a starting material ratio of 1.0 but observed for that of 1.2. Thin films annealed at 400 °C with a starting material ratio of 1.5 contained several phases. We found that the Ag/In ratios of the films could be controlled by changing the starting material ratio. Grains of films with composition ratios of 1.0 and 1.2 were nonuniform, whereas those with a composition ratio of 1.5 were uniform.",

author = "Yoji Akaki and Kyohei Yamashita and Tsuyoshi Yoshitake and Shigeuki Nakamura and Takahiro Tokuda and Kenji Yoshino",

year = "2011",

month = may,

doi = "10.1143/JJAP.50.05FB06",

language = "English",

volume = "50",

journal = "Japanese journal of applied physics",

issn = "0021-4922",

publisher = "The Japan Society of Applied Physics",

number = "5 PART 3",

}

TY - JOUR

T1 - Effect of H2S annealing on Ag-rich Ag-In-S thin films prepared by vacuum evaporation

AU - Akaki, Yoji

AU - Yamashita, Kyohei

AU - Yoshitake, Tsuyoshi

AU - Nakamura, Shigeuki

AU - Tokuda, Takahiro

AU - Yoshino, Kenji

PY - 2011/5

Y1 - 2011/5

N2 - We investigated the effect of H2S annealing on Ag-In-S thin films prepared by vacuum evaporation. In thin films annealed above 350 °C, diffraction peaks except chalcopyrite AgInS2 phase were not observed for a starting material ratio of 1.0 but observed for that of 1.2. Thin films annealed at 400 °C with a starting material ratio of 1.5 contained several phases. We found that the Ag/In ratios of the films could be controlled by changing the starting material ratio. Grains of films with composition ratios of 1.0 and 1.2 were nonuniform, whereas those with a composition ratio of 1.5 were uniform.

AB - We investigated the effect of H2S annealing on Ag-In-S thin films prepared by vacuum evaporation. In thin films annealed above 350 °C, diffraction peaks except chalcopyrite AgInS2 phase were not observed for a starting material ratio of 1.0 but observed for that of 1.2. Thin films annealed at 400 °C with a starting material ratio of 1.5 contained several phases. We found that the Ag/In ratios of the films could be controlled by changing the starting material ratio. Grains of films with composition ratios of 1.0 and 1.2 were nonuniform, whereas those with a composition ratio of 1.5 were uniform.

UR - http://www.scopus.com/inward/record.url?scp=79957590944&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=79957590944&partnerID=8YFLogxK

U2 - 10.1143/JJAP.50.05FB06

DO - 10.1143/JJAP.50.05FB06

M3 - Article

AN - SCOPUS:79957590944

SN - 0021-4922

VL - 50

JO - Japanese journal of applied physics

JF - Japanese journal of applied physics

IS - 5 PART 3

M1 - 05FB06

ER -

Effect of H₂S annealing on Ag-rich Ag-In-S thin films prepared by vacuum evaporation

Abstract

All Science Journal Classification (ASJC) codes

Access to Document

Other files and links

Fingerprint

Cite this