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Distribution-controlled X-identification for effective reduction of launch-induced IR-drop in at-speed scan testing
Kohei Miyase, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Yuta Yamato, Hiroshi Furukawa, Xiaoqing Wen, Seiji Kajihara
Research output: Contribution to journal › Article › peer-review