Diagnostics of PDP micro-discharge plasmas using infrared laser thomson scattering system

Y. Sonoda; A. Akune; K. Tomita; S. Hassaballa; K. Uchino; K. Ishii; Y. Hirano; Y. Murakami

Diagnostics of PDP micro-discharge plasmas using infrared laser thomson scattering system

Y. Sonoda, A. Akune, K. Tomita, S. Hassaballa, K. Uchino, K. Ishii, Y. Hirano, Y. Murakami

Electrical Engineering Sciences

Research output: Contribution to conference › Paper › peer-review

1 Citation (Scopus)

Abstract

In order to avoid laser perturbations for Xe containing discharges, the laser Thomson scattering (LTS) system having an infrared laser at a wavelength of 1064 nm as a light source has been developed. The basic behavior of electrons in the Ne/Xe discharges was investigated by using the infrared LTS system. Furthermore, it was demonstrated that the measurement of the electron energy distribution function was possible up to the electron energy corresponding to the excitation energy of the Xe atom.

Original language	English
Pages	861-864
Number of pages	4
Publication status	Published - 2007
Event	14th International Display Workshops, IDW '07 - Sapporo, Japan Duration: Dec 5 2007 → Dec 5 2007

Other

Other	14th International Display Workshops, IDW '07
Country/Territory	Japan
City	Sapporo
Period	12/5/07 → 12/5/07

All Science Journal Classification (ASJC) codes

Electrical and Electronic Engineering
Electronic, Optical and Magnetic Materials
Radiology Nuclear Medicine and imaging
Atomic and Molecular Physics, and Optics

Cite this

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title = "Diagnostics of PDP micro-discharge plasmas using infrared laser thomson scattering system",

abstract = "In order to avoid laser perturbations for Xe containing discharges, the laser Thomson scattering (LTS) system having an infrared laser at a wavelength of 1064 nm as a light source has been developed. The basic behavior of electrons in the Ne/Xe discharges was investigated by using the infrared LTS system. Furthermore, it was demonstrated that the measurement of the electron energy distribution function was possible up to the electron energy corresponding to the excitation energy of the Xe atom.",

author = "Y. Sonoda and A. Akune and K. Tomita and S. Hassaballa and K. Uchino and K. Ishii and Y. Hirano and Y. Murakami",

year = "2007",

language = "English",

pages = "861--864",

note = "14th International Display Workshops, IDW '07 ; Conference date: 05-12-2007 Through 05-12-2007",

}

TY - CONF

T1 - Diagnostics of PDP micro-discharge plasmas using infrared laser thomson scattering system

AU - Sonoda, Y.

AU - Akune, A.

AU - Tomita, K.

AU - Hassaballa, S.

AU - Uchino, K.

AU - Ishii, K.

AU - Hirano, Y.

AU - Murakami, Y.

PY - 2007

Y1 - 2007

N2 - In order to avoid laser perturbations for Xe containing discharges, the laser Thomson scattering (LTS) system having an infrared laser at a wavelength of 1064 nm as a light source has been developed. The basic behavior of electrons in the Ne/Xe discharges was investigated by using the infrared LTS system. Furthermore, it was demonstrated that the measurement of the electron energy distribution function was possible up to the electron energy corresponding to the excitation energy of the Xe atom.

AB - In order to avoid laser perturbations for Xe containing discharges, the laser Thomson scattering (LTS) system having an infrared laser at a wavelength of 1064 nm as a light source has been developed. The basic behavior of electrons in the Ne/Xe discharges was investigated by using the infrared LTS system. Furthermore, it was demonstrated that the measurement of the electron energy distribution function was possible up to the electron energy corresponding to the excitation energy of the Xe atom.

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UR - http://www.scopus.com/inward/citedby.url?scp=43349096061&partnerID=8YFLogxK

M3 - Paper

AN - SCOPUS:43349096061

SP - 861

EP - 864

T2 - 14th International Display Workshops, IDW '07

Y2 - 5 December 2007 through 5 December 2007

ER -

Diagnostics of PDP micro-discharge plasmas using infrared laser thomson scattering system

Abstract

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All Science Journal Classification (ASJC) codes

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