Development of total internal reflection raman microscope with an apparatus for adhesion test and changes in depolarization ratio of polymer brush by compressive force

Saburo Yamamoto; Tatsuya Kubozono; Ken Kojio; Atsushi Takahara

doi:10.1295/koron.2015-0043

Development of total internal reflection raman microscope with an apparatus for adhesion test and changes in depolarization ratio of polymer brush by compressive force

Saburo Yamamoto, Tatsuya Kubozono, Ken Kojio, Atsushi Takahara

Department of Applied Molecular Chemistry

Research output: Contribution to journal › Article › peer-review

Abstract

A new total internal reflection (TIR) Raman microscope that can be used for adhesion testing based on the Johnson-Kendall-Roberts (JKR) theory was developed. The angle and the focus of the laser beam can be accurately controlled by observing the image of the laser spot on a CCD camera in the spectrometer. As a result, strong Raman signals were obtained. It was observed that the depolarization ratio of polymer brushes changes with the compressive force. This equipment is useful for the analysis of the interface and the anisotropic structure of polymer thin films.

Original language	English
Pages (from-to)	673-680
Number of pages	8
Journal	KOBUNSHI RONBUNSHU
Volume	72
Issue number	11
DOIs	https://doi.org/10.1295/koron.2015-0043
Publication status	Published - 2015

All Science Journal Classification (ASJC) codes

Chemical Engineering (miscellaneous)
Materials Science (miscellaneous)
Environmental Science(all)
Polymers and Plastics

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10.1295/koron.2015-0043

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@article{10642a4d80b0447497374b5df5466937,

title = "Development of total internal reflection raman microscope with an apparatus for adhesion test and changes in depolarization ratio of polymer brush by compressive force",

abstract = "A new total internal reflection (TIR) Raman microscope that can be used for adhesion testing based on the Johnson-Kendall-Roberts (JKR) theory was developed. The angle and the focus of the laser beam can be accurately controlled by observing the image of the laser spot on a CCD camera in the spectrometer. As a result, strong Raman signals were obtained. It was observed that the depolarization ratio of polymer brushes changes with the compressive force. This equipment is useful for the analysis of the interface and the anisotropic structure of polymer thin films.",

author = "Saburo Yamamoto and Tatsuya Kubozono and Ken Kojio and Atsushi Takahara",

note = "Publisher Copyright: {\textcopyright} 2015, The Society of Polymer Science, Japan.",

year = "2015",

doi = "10.1295/koron.2015-0043",

language = "English",

volume = "72",

pages = "673--680",

journal = "KOBUNSHI RONBUNSHU",

issn = "0386-2186",

publisher = "The Society of Polymer Science, Japan",

number = "11",

}

TY - JOUR

T1 - Development of total internal reflection raman microscope with an apparatus for adhesion test and changes in depolarization ratio of polymer brush by compressive force

AU - Yamamoto, Saburo

AU - Kubozono, Tatsuya

AU - Kojio, Ken

AU - Takahara, Atsushi

PY - 2015

Y1 - 2015

N2 - A new total internal reflection (TIR) Raman microscope that can be used for adhesion testing based on the Johnson-Kendall-Roberts (JKR) theory was developed. The angle and the focus of the laser beam can be accurately controlled by observing the image of the laser spot on a CCD camera in the spectrometer. As a result, strong Raman signals were obtained. It was observed that the depolarization ratio of polymer brushes changes with the compressive force. This equipment is useful for the analysis of the interface and the anisotropic structure of polymer thin films.

AB - A new total internal reflection (TIR) Raman microscope that can be used for adhesion testing based on the Johnson-Kendall-Roberts (JKR) theory was developed. The angle and the focus of the laser beam can be accurately controlled by observing the image of the laser spot on a CCD camera in the spectrometer. As a result, strong Raman signals were obtained. It was observed that the depolarization ratio of polymer brushes changes with the compressive force. This equipment is useful for the analysis of the interface and the anisotropic structure of polymer thin films.

UR - http://www.scopus.com/inward/record.url?scp=84962499893&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84962499893&partnerID=8YFLogxK

U2 - 10.1295/koron.2015-0043

DO - 10.1295/koron.2015-0043

M3 - Article

AN - SCOPUS:84962499893

SN - 0386-2186

VL - 72

SP - 673

EP - 680

JO - KOBUNSHI RONBUNSHU

JF - KOBUNSHI RONBUNSHU

IS - 11

ER -

Development of total internal reflection raman microscope with an apparatus for adhesion test and changes in depolarization ratio of polymer brush by compressive force

Abstract

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