Development of the multi-pixel x-ray microcalorimeters

H. Kudo, T. Nakamura, T. Arakawa, S. Ohtsuka, T. Izumi, S. Shoji, H. Sato, H. Kobayashi, K. Mori, T. Homma, T. Osaka, K. Mitsuda, N. Y. Yamasaki, R. Fujimoto, N. Iyomoto, T. Oshima, K. Futamoto, Y. Takei, T. Ichitsubo, T. FujimoriY. Ishisaki, U. Morita, T. Koga, K. Sato, T. Ohashi, Y. Kuroda, M. Onishi, K. Otake

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)


An x-ray microcalorimeter is a promising x-ray spectrometer for its extremely good energy resolution and its good detecting efficiency. We are developing an x-ray microcalorimeter for high energy resolution x-ray imaging application. The energy resolution of 43eV(FWHM) at 5.9keV is obtained with our x-ray microcalorimeter. The intrinsic performance of our x-ray microcalorimeter was estimated to be 10.4eV(FWHM) at 5.9keV. This value is more than 10 times better than that of the conventional x-ray CCD.

Original languageEnglish
Title of host publication2003 Nanotechnology Conference and Trade Show - Nanotech 2003
EditorsM. Laudon, B. Romanowicz
Number of pages4
Publication statusPublished - 2003
Externally publishedYes
Event2003 Nanotechnology Conference and Trade Show - Nanotech 2003 - San Francisco, CA, United States
Duration: Feb 23 2003Feb 27 2003

Publication series

Name2003 Nanotechnology Conference and Trade Show - Nanotech 2003


Other2003 Nanotechnology Conference and Trade Show - Nanotech 2003
Country/TerritoryUnited States
CitySan Francisco, CA

All Science Journal Classification (ASJC) codes

  • General Engineering


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