Development of LEED apparatus using nano-tips fabricated by field-assisted etching

Jo Onoda, Tomomi Kanaoka, Megumi Kumon, Seigi Mizuno

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    4 Citations (Scopus)


    We have developed a low-energy electron diffraction (LEED) apparatus using field emission (FE) from scanning tunneling microscopy (STM) tips. Tips fabricated by field-assisted H2O etching enabled us to observe LEED patterns of few layer graphene grown on SiC(0001) reproducibly. The obtained hexagonal patterns showed a bias dependency and those obtained at sample biases of 93 V, 56 V, and 28 V were interpreted as patterns derived from the graphene, the SiC(0001) substrate, and a (6√3 × 6√3)R30° buffer layer, respectively. The analysis of Ewald sphere construction indicated that the opening angles of FE from the tip could be deduced directly from the LEED patterns, and their experimentally obtained value was ∼13°. From the opening angle of FE and the dataset of tip-to-sample distances, the irradiated areas were estimated at 350 nmø when the sample bias was 100 V.

    Original languageEnglish
    Pages (from-to)292-296
    Number of pages5
    Journale-Journal of Surface Science and Nanotechnology
    Publication statusPublished - 2012

    All Science Journal Classification (ASJC) codes

    • Biotechnology
    • Bioengineering
    • Condensed Matter Physics
    • Mechanics of Materials
    • Surfaces and Interfaces
    • Surfaces, Coatings and Films


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