Development of double-probe piezo-driving holder for TEM

K. Yamazaki; I. Ishikawa; S. Deguchi; Y. Kondo; Y. Murakami; D. Shindo

doi:10.1017/S1431927608083165

Development of double-probe piezo-driving holder for TEM

K. Yamazaki
, I. Ishikawa
, S. Deguchi
, Y. Kondo
, Y. Murakami
, D. Shindo

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	814-815
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	14
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927608083165
Publication status	Published - Aug 2008
Externally published	Yes

All Science Journal Classification (ASJC) codes

Instrumentation

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10.1017/S1431927608083165

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title = "Development of double-probe piezo-driving holder for TEM",

author = "K. Yamazaki and I. Ishikawa and S. Deguchi and Y. Kondo and Y. Murakami and D. Shindo",

year = "2008",

month = aug,

doi = "10.1017/S1431927608083165",

language = "English",

volume = "14",

pages = "814--815",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "SUPPL. 2",

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TY - JOUR

T1 - Development of double-probe piezo-driving holder for TEM

AU - Yamazaki, K.

AU - Ishikawa, I.

AU - Deguchi, S.

AU - Kondo, Y.

AU - Murakami, Y.

AU - Shindo, D.

PY - 2008/8

Y1 - 2008/8

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UR - https://www.scopus.com/pages/publications/49649116453#tab=citedBy

U2 - 10.1017/S1431927608083165

DO - 10.1017/S1431927608083165

M3 - Article

AN - SCOPUS:49649116453

SN - 1431-9276

VL - 14

SP - 814

EP - 815

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -

Development of double-probe piezo-driving holder for TEM

All Science Journal Classification (ASJC) codes

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