TY - JOUR
T1 - Development of density-inclination plasmas for analysis of plasma nano-processes via combinatorial method
AU - Setsuhara, Yuichi
AU - Nagao, Katsuhisa
AU - Shiratani, Masaharu
AU - Sekine, Makoto
AU - Hori, Masaru
N1 - Funding Information:
Part of this work was supported by The Global COE Program “Center of Excellence for Advanced Structural and Functional Materials Design” from the Ministry of Education, Culture, Sports, Science and Technology (MEXT) , Japan, and Grant-in-Aid for Cooperative Research Project of Nationwide Joint-Use Research Institutes on Development Base of Joining Technology for New Metallic Glasses and Inorganic Materials from MEXT, Japan.
PY - 2009/12/30
Y1 - 2009/12/30
N2 - We have developed a plasma-process analyzer based on the "combinatorial method", in which process examinations with a continuous variation of sample-preparation conditions can be carried out in one execution of experiment via placing substrates on a substrate holder with an inclined distribution of process parameters (ion flux and radical flux) and the distributions of particle fluxes are finely controlled and characterized via particle diagnostics. In the present study, plasma-fluid simulations have been performed to show the feasibility of the combinatorial plasma-process analyzer, in which density inclinations of the plasma parameters (ion density, radical density) are obtained via sustaining plasmas by localized deposition of discharge power using low-inductance antenna modules. The simulation results showed that density-inclination plasmas were feasible by localized power deposition for sustaining plasmas, indicating that a variety of process conditions can be efficiently analyzed via placing substrates on a substrate holder, along which process parameters are inclined.
AB - We have developed a plasma-process analyzer based on the "combinatorial method", in which process examinations with a continuous variation of sample-preparation conditions can be carried out in one execution of experiment via placing substrates on a substrate holder with an inclined distribution of process parameters (ion flux and radical flux) and the distributions of particle fluxes are finely controlled and characterized via particle diagnostics. In the present study, plasma-fluid simulations have been performed to show the feasibility of the combinatorial plasma-process analyzer, in which density inclinations of the plasma parameters (ion density, radical density) are obtained via sustaining plasmas by localized deposition of discharge power using low-inductance antenna modules. The simulation results showed that density-inclination plasmas were feasible by localized power deposition for sustaining plasmas, indicating that a variety of process conditions can be efficiently analyzed via placing substrates on a substrate holder, along which process parameters are inclined.
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U2 - 10.1016/j.tsf.2009.07.162
DO - 10.1016/j.tsf.2009.07.162
M3 - Article
AN - SCOPUS:70350506617
SN - 0040-6090
VL - 518
SP - 1020
EP - 1023
JO - Thin Solid Films
JF - Thin Solid Films
IS - 3
ER -