Development of an advanced low-energy electron diffraction technique using field-emitted electrons from scanning tunneling microscope tips

Seigi Mizuno

doi:10.1116/1.1401751

Development of an advanced low-energy electron diffraction technique using field-emitted electrons from scanning tunneling microscope tips

Seigi Mizuno

Research output: Contribution to journal › Article › peer-review

12 Citations (Scopus)

Abstract

The demonstration of a prototype instrument was presented which employed a new technique for determination of surface structures. The instrument consisted of a detector for projecting electron scattering patterns and a scanning tunneling microscope (STM) tip as a field emission gun. The tips operation under a field emission condition with 14 - 50 V bias voltages made it possible to observe the electron scattering patterns. Comparison of the experimentally obtained patterns was done with calculated results showing close correlation, signifying that the obtained patterns were caused by the electrons scattered on a sample surface after emission from a STM tip.

Original language	English
Pages (from-to)	1874-1878
Number of pages	5
Journal	Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Volume	19
Issue number	5
DOIs	https://doi.org/10.1116/1.1401751
Publication status	Published - Sept 2001

All Science Journal Classification (ASJC) codes

Condensed Matter Physics
Electrical and Electronic Engineering

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10.1116/1.1401751

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abstract = "The demonstration of a prototype instrument was presented which employed a new technique for determination of surface structures. The instrument consisted of a detector for projecting electron scattering patterns and a scanning tunneling microscope (STM) tip as a field emission gun. The tips operation under a field emission condition with 14 - 50 V bias voltages made it possible to observe the electron scattering patterns. Comparison of the experimentally obtained patterns was done with calculated results showing close correlation, signifying that the obtained patterns were caused by the electrons scattered on a sample surface after emission from a STM tip.",

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AB - The demonstration of a prototype instrument was presented which employed a new technique for determination of surface structures. The instrument consisted of a detector for projecting electron scattering patterns and a scanning tunneling microscope (STM) tip as a field emission gun. The tips operation under a field emission condition with 14 - 50 V bias voltages made it possible to observe the electron scattering patterns. Comparison of the experimentally obtained patterns was done with calculated results showing close correlation, signifying that the obtained patterns were caused by the electrons scattered on a sample surface after emission from a STM tip.

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Development of an advanced low-energy electron diffraction technique using field-emitted electrons from scanning tunneling microscope tips

Abstract

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