Development of a RIMS-based FFDL system at the experimental fast reactor JOYO

Hideki Harano, Chikara Ito, Kenichi Watanabe, Tetsuo Iguchi

Research output: Contribution to journalArticlepeer-review

9 Citations (Scopus)


A series of experiments has been examined the applicability of RIMS to the trace xenon isotopic analysis needed for the tagging gas FFDL. The measurement of the JOYO cover gas equivalent clarified the existence of non-resonantly produced argon ions which could disturb the trace analysis. We proposed to apply the mass gating and solved the problem, which enabled us to succeed in demonstrating that RIMS satisfies the requirement for the FFDL and the MONJU.

Original languageEnglish
Pages (from-to)307-310
Number of pages4
JournalInternational Journal of Applied Electromagnetics and Mechanics
Issue number1-4 SPEC.
Publication statusPublished - 2001
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering
  • Electrical and Electronic Engineering


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