Abstract
A series of experiments has been examined the applicability of RIMS to the trace xenon isotopic analysis needed for the tagging gas FFDL. The measurement of the JOYO cover gas equivalent clarified the existence of non-resonantly produced argon ions which could disturb the trace analysis. We proposed to apply the mass gating and solved the problem, which enabled us to succeed in demonstrating that RIMS satisfies the requirement for the FFDL and the MONJU.
Original language | English |
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Pages (from-to) | 307-310 |
Number of pages | 4 |
Journal | International Journal of Applied Electromagnetics and Mechanics |
Volume | 14 |
Issue number | 1-4 SPEC. |
DOIs | |
Publication status | Published - 2001 |
Externally published | Yes |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering
- Electrical and Electronic Engineering