TY - GEN
T1 - Development of a laser-guided deep small-sized hole-measurement system
T2 - 15th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2015
AU - Katsuki, Akio
AU - Sajima, Takao
AU - Murakami, Hiroshi
AU - Hazrat, Ali Md
AU - Ohnishi, Osamu
AU - Akashi, Kouji
N1 - Copyright:
Copyright 2015 Elsevier B.V., All rights reserved.
PY - 2015
Y1 - 2015
N2 - A measurement system for measuring a small-sized hole with a 17 to 21 mm diameter and 1 000 mm length was constructed. The constructed system consists of a measurement probe, a laser interferometer for detecting the roundness of a hole, and an optical system for detecting the probe position and inclination. The probe consists of a rotatable measurement unit with a pentaprism and corner cube prism, a DC motor for rotating the measurement unit, and a laser diode to radiate a laser beam toward the optical system. In this study, the measurement accuracy of the system is examined through a comparison with other measurement instruments. Further, factors causing measurement errors are analyzed and discussed. As a result, it is clear that a deviation of the probe from the center of the hole and the fabrication error of the probe adversely affect measurement accuracy. Further, small deviations lead to a decrease in measurement errors and a simplification of the measurement system.
AB - A measurement system for measuring a small-sized hole with a 17 to 21 mm diameter and 1 000 mm length was constructed. The constructed system consists of a measurement probe, a laser interferometer for detecting the roundness of a hole, and an optical system for detecting the probe position and inclination. The probe consists of a rotatable measurement unit with a pentaprism and corner cube prism, a DC motor for rotating the measurement unit, and a laser diode to radiate a laser beam toward the optical system. In this study, the measurement accuracy of the system is examined through a comparison with other measurement instruments. Further, factors causing measurement errors are analyzed and discussed. As a result, it is clear that a deviation of the probe from the center of the hole and the fabrication error of the probe adversely affect measurement accuracy. Further, small deviations lead to a decrease in measurement errors and a simplification of the measurement system.
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M3 - Conference contribution
AN - SCOPUS:84936104252
T3 - Proceedings of the 15th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2015
SP - 201
EP - 202
BT - Proceedings of the 15th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2015
A2 - Leach, R.
PB - euspen
Y2 - 1 June 2015 through 5 June 2015
ER -