TY - GEN
T1 - Development and performance evaluation of Thick-GEM
AU - Yamaguchi, Yorito
AU - Hamagaki, Hideki
AU - Gunji, Taku
AU - Oda, Susumu
AU - Aramaki, Yoki
AU - Sano, Satoshi
AU - Tamagawa, Toru
N1 - Copyright:
Copyright 2008 Elsevier B.V., All rights reserved.
PY - 2007
Y1 - 2007
N2 - A Gas Electron Multiplier with a thick insulator such as a 100 μm or 150 μm thick insulator (Thick-GEM) has been developed by dry etching successfully in Japan. The electric field inside a hole of the Thick-GEM was calculated and the basic properties of the Thick-GEM were measured. A much stronger electric field can be realized inside the hole of the Thick-GEM than that of a GEM with a 50 μm thick insulator (Standard-GEM). The Thick-GEM can attain much higher gain than the Standard-GEM and has a good gain stability within 1.0% for 9 hours. In this paper, the characteristics of the Thick-GEM are described compared with the Standard-GEM.
AB - A Gas Electron Multiplier with a thick insulator such as a 100 μm or 150 μm thick insulator (Thick-GEM) has been developed by dry etching successfully in Japan. The electric field inside a hole of the Thick-GEM was calculated and the basic properties of the Thick-GEM were measured. A much stronger electric field can be realized inside the hole of the Thick-GEM than that of a GEM with a 50 μm thick insulator (Standard-GEM). The Thick-GEM can attain much higher gain than the Standard-GEM and has a good gain stability within 1.0% for 9 hours. In this paper, the characteristics of the Thick-GEM are described compared with the Standard-GEM.
UR - http://www.scopus.com/inward/record.url?scp=48149085909&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=48149085909&partnerID=8YFLogxK
U2 - 10.1109/NSSMIC.2007.4437144
DO - 10.1109/NSSMIC.2007.4437144
M3 - Conference contribution
AN - SCOPUS:48149085909
SN - 1424409233
SN - 9781424409235
T3 - IEEE Nuclear Science Symposium Conference Record
SP - 4645
EP - 4648
BT - 2007 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS-MIC
T2 - 2007 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS-MIC
Y2 - 27 October 2007 through 3 November 2007
ER -