Determining the thickness of chemically modified graphenes by scanning probe microscopy

P. Solís-Fernández; J. I. Paredes; S. Villar-Rodil; A. Martínez-Alonso; J. M.D. Tascón

doi:10.1016/j.carbon.2010.03.033

Determining the thickness of chemically modified graphenes by scanning probe microscopy

P. Solís-Fernández, J. I. Paredes, S. Villar-Rodil, A. Martínez-Alonso, J. M.D. Tascón

Research output: Contribution to journal › Letter › peer-review

38 Citations (Scopus)

Abstract

The thickness of unreduced and chemically reduced graphene oxide sheets deposited on different substrates was measured by different scanning probe microscopy (SPM) variants. Inaccurate and inconsistent results are obtained when thickness is derived as a sheet-to-substrate height, which is the typically employed approach to determine such a parameter. Measuring overlapped regions between different sheets leads to more realistic thickness values, which clearly reflect, for example, the removal of oxygen functionalities from graphene oxide following chemical reduction. The results underline the precautions that are required to draw valid conclusions from SPM-derived thickness data of chemically modified graphenes.

Original language	English
Pages (from-to)	2657-2660
Number of pages	4
Journal	Carbon
Volume	48
Issue number	9
DOIs	https://doi.org/10.1016/j.carbon.2010.03.033
Publication status	Published - Aug 2010
Externally published	Yes

All Science Journal Classification (ASJC) codes

Chemistry(all)
Materials Science(all)

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10.1016/j.carbon.2010.03.033

Cite this

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title = "Determining the thickness of chemically modified graphenes by scanning probe microscopy",

abstract = "The thickness of unreduced and chemically reduced graphene oxide sheets deposited on different substrates was measured by different scanning probe microscopy (SPM) variants. Inaccurate and inconsistent results are obtained when thickness is derived as a sheet-to-substrate height, which is the typically employed approach to determine such a parameter. Measuring overlapped regions between different sheets leads to more realistic thickness values, which clearly reflect, for example, the removal of oxygen functionalities from graphene oxide following chemical reduction. The results underline the precautions that are required to draw valid conclusions from SPM-derived thickness data of chemically modified graphenes.",

author = "P. Sol{\'i}s-Fern{\'a}ndez and Paredes, {J. I.} and S. Villar-Rodil and A. Mart{\'i}nez-Alonso and Tasc{\'o}n, {J. M.D.}",

note = "Funding Information: P.S.-F. acknowledges receipt of an I3P pre-doctoral contract from CSIC. Financial support by the Spanish MICINN (Project MAT2008-05700) and PCTI del Principado de Asturias (Project IB09-151) is gratefully acknowledged. ",

year = "2010",

month = aug,

doi = "10.1016/j.carbon.2010.03.033",

language = "English",

volume = "48",

pages = "2657--2660",

journal = "Carbon",

issn = "0008-6223",

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T1 - Determining the thickness of chemically modified graphenes by scanning probe microscopy

AU - Solís-Fernández, P.

AU - Paredes, J. I.

AU - Villar-Rodil, S.

AU - Martínez-Alonso, A.

AU - Tascón, J. M.D.

N1 - Funding Information: P.S.-F. acknowledges receipt of an I3P pre-doctoral contract from CSIC. Financial support by the Spanish MICINN (Project MAT2008-05700) and PCTI del Principado de Asturias (Project IB09-151) is gratefully acknowledged.

PY - 2010/8

Y1 - 2010/8

N2 - The thickness of unreduced and chemically reduced graphene oxide sheets deposited on different substrates was measured by different scanning probe microscopy (SPM) variants. Inaccurate and inconsistent results are obtained when thickness is derived as a sheet-to-substrate height, which is the typically employed approach to determine such a parameter. Measuring overlapped regions between different sheets leads to more realistic thickness values, which clearly reflect, for example, the removal of oxygen functionalities from graphene oxide following chemical reduction. The results underline the precautions that are required to draw valid conclusions from SPM-derived thickness data of chemically modified graphenes.

AB - The thickness of unreduced and chemically reduced graphene oxide sheets deposited on different substrates was measured by different scanning probe microscopy (SPM) variants. Inaccurate and inconsistent results are obtained when thickness is derived as a sheet-to-substrate height, which is the typically employed approach to determine such a parameter. Measuring overlapped regions between different sheets leads to more realistic thickness values, which clearly reflect, for example, the removal of oxygen functionalities from graphene oxide following chemical reduction. The results underline the precautions that are required to draw valid conclusions from SPM-derived thickness data of chemically modified graphenes.

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DO - 10.1016/j.carbon.2010.03.033

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SP - 2657

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JO - Carbon

JF - Carbon

IS - 9

ER -

Determining the thickness of chemically modified graphenes by scanning probe microscopy

Abstract

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