Determination of 16O and 18O sensitivity factors and charge-exchange processes in low-energy ion scattering

H. Téllez; R. J. Chater; S. Fearn; E. Symianakis; H. H. Brongersma; J. A. Kilner

doi:10.1063/1.4758699

Determination of ¹⁶O and ¹⁸O sensitivity factors and charge-exchange processes in low-energy ion scattering

H. Téllez, R. J. Chater, S. Fearn, E. Symianakis, H. H. Brongersma, J. A. Kilner

Research output: Contribution to journal › Article › peer-review

11 Citations (Scopus)

Abstract

Quantitative analysis in low-energy ion scattering (LEIS) requires an understanding of the charge-exchange processes to estimate the elemental sensitivity factors. In this work, the neutralization of He scattered by ¹⁸O-exchanged silica at energies between 0.6 and 7 keV was studied. The process is dominated by Auger neutralization for E _i 0.8 keV. An additional mechanism starts above the reionization threshold. This collision-induced neutralization becomes the dominant mechanism for E _i > 2 keV. The ion fractions P were determined for Si and O using the characteristic velocity method to quantify the surface density. The ¹⁸O/ ¹⁶O sensitivity ratio indicates an 18 higher sensitivity for the heavier O isotope.

Original language	English
Article number	151602
Journal	Applied Physics Letters
Volume	101
Issue number	15
DOIs	https://doi.org/10.1063/1.4758699
Publication status	Published - Oct 8 2012
Externally published	Yes

All Science Journal Classification (ASJC) codes

Physics and Astronomy (miscellaneous)

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10.1063/1.4758699

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title = "Determination of 16O and 18O sensitivity factors and charge-exchange processes in low-energy ion scattering",

abstract = "Quantitative analysis in low-energy ion scattering (LEIS) requires an understanding of the charge-exchange processes to estimate the elemental sensitivity factors. In this work, the neutralization of He scattered by 18O-exchanged silica at energies between 0.6 and 7 keV was studied. The process is dominated by Auger neutralization for E i 0.8 keV. An additional mechanism starts above the reionization threshold. This collision-induced neutralization becomes the dominant mechanism for E i > 2 keV. The ion fractions P were determined for Si and O using the characteristic velocity method to quantify the surface density. The 18O/ 16O sensitivity ratio indicates an 18 higher sensitivity for the heavier O isotope.",

author = "H. T{\'e}llez and Chater, {R. J.} and S. Fearn and E. Symianakis and Brongersma, {H. H.} and Kilner, {J. A.}",

note = "Funding Information: This research was supported by a Marie Curie Intra European Fellowship (HT) within the 7th European Community Framework Programme the European Union (IonBeatHeteroMat, PIEF-GA-2010-274999).",

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doi = "10.1063/1.4758699",

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AU - Téllez, H.

AU - Chater, R. J.

AU - Fearn, S.

AU - Symianakis, E.

AU - Brongersma, H. H.

AU - Kilner, J. A.

N1 - Funding Information: This research was supported by a Marie Curie Intra European Fellowship (HT) within the 7th European Community Framework Programme the European Union (IonBeatHeteroMat, PIEF-GA-2010-274999).

PY - 2012/10/8

Y1 - 2012/10/8

N2 - Quantitative analysis in low-energy ion scattering (LEIS) requires an understanding of the charge-exchange processes to estimate the elemental sensitivity factors. In this work, the neutralization of He scattered by 18O-exchanged silica at energies between 0.6 and 7 keV was studied. The process is dominated by Auger neutralization for E i 0.8 keV. An additional mechanism starts above the reionization threshold. This collision-induced neutralization becomes the dominant mechanism for E i > 2 keV. The ion fractions P were determined for Si and O using the characteristic velocity method to quantify the surface density. The 18O/ 16O sensitivity ratio indicates an 18 higher sensitivity for the heavier O isotope.

AB - Quantitative analysis in low-energy ion scattering (LEIS) requires an understanding of the charge-exchange processes to estimate the elemental sensitivity factors. In this work, the neutralization of He scattered by 18O-exchanged silica at energies between 0.6 and 7 keV was studied. The process is dominated by Auger neutralization for E i 0.8 keV. An additional mechanism starts above the reionization threshold. This collision-induced neutralization becomes the dominant mechanism for E i > 2 keV. The ion fractions P were determined for Si and O using the characteristic velocity method to quantify the surface density. The 18O/ 16O sensitivity ratio indicates an 18 higher sensitivity for the heavier O isotope.

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Determination of ¹⁶O and ¹⁸O sensitivity factors and charge-exchange processes in low-energy ion scattering

Abstract

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