TY - JOUR
T1 - Detection of the scintillation light emitted from direct-bandgap compound semiconductors by a Si avalanche photodiode at 150 mK
AU - Yasumune, Takashi
AU - Takayama, Nobuyasu
AU - Maehata, Keisuke
AU - Ishibashi, Kenji
AU - Umeno, Takahiro
N1 - Publisher Copyright:
© 2008, Taylor and Francis Ltd. All rights reserved.
PY - 2008
Y1 - 2008
N2 - In this work, the direct-bandgap compound semiconductor materials are irradiated by α particles emitted from 241Am for the detection of scintillation light at the temperature of 150 mK. For the irradiation experiment, two disk shaped samples were fabricated from an epoxy resin mixed with the powder of PbI2 and CuI, respectively. Each disk-samples was cooled down to 150 mK by a compact liquid helium-free dilution refrigerator. A Si avalanche photodiode (APD) was employed for detecting the scintillation light emitted from the disk-sample inside the refrigerator. The detection signal current of Si APD was converted into the voltage pulses by a charge sensitive preamplifier. The voltage pulses of the scintillation light emitted from the direct-bandgap semiconductors were observed at the temperature of 150 mK.
AB - In this work, the direct-bandgap compound semiconductor materials are irradiated by α particles emitted from 241Am for the detection of scintillation light at the temperature of 150 mK. For the irradiation experiment, two disk shaped samples were fabricated from an epoxy resin mixed with the powder of PbI2 and CuI, respectively. Each disk-samples was cooled down to 150 mK by a compact liquid helium-free dilution refrigerator. A Si avalanche photodiode (APD) was employed for detecting the scintillation light emitted from the disk-sample inside the refrigerator. The detection signal current of Si APD was converted into the voltage pulses by a charge sensitive preamplifier. The voltage pulses of the scintillation light emitted from the direct-bandgap semiconductors were observed at the temperature of 150 mK.
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U2 - 10.1080/00223131.2008.10875886
DO - 10.1080/00223131.2008.10875886
M3 - Article
AN - SCOPUS:84912013646
SN - 0022-3131
VL - 45
SP - 447
EP - 450
JO - journal of nuclear science and technology
JF - journal of nuclear science and technology
ER -