Deposition process, microstructure and properties of YBCO film fabricated by advanced TFA-MOD method

T. Tanaka, K. Tada, N. Mori, K. Yamada, R. Teranishi, M. Mukaida, Y. Shiohara, T. Izumi, J. Matsuda

    Research output: Contribution to journalArticlepeer-review

    6 Citations (Scopus)


    The metal organic deposition (MOD) process using trifluoroacetates is expected as a promising method for producing YBCO coated conductors since the high JC performance can be provided by this low cost non-vacuum process. Investigation of the growth mechanism for the YBCO films is important to obtain the high crystal grain alignment for high JC in thick films. In order to clarify the YBCO growth mechanism in detail, we fabricated YBCO films on LaAlO3 (LAO) or CeO2/LAO substrate and investigated the microstructures of the films quenched during the crystallization process. The effects of the crystallization temperature and time on the microstructures of the films and its formation process as well as the JC values were studied. The YBCO growth model during crystallization was proposed according to the observation results of YBCO formation process.

    Original languageEnglish
    Pages (from-to)527-531
    Number of pages5
    JournalPhysica C: Superconductivity and its applications
    Issue numberSUPPL.
    Publication statusPublished - Oct 1 2007

    All Science Journal Classification (ASJC) codes

    • Electronic, Optical and Magnetic Materials
    • Condensed Matter Physics
    • Energy Engineering and Power Technology
    • Electrical and Electronic Engineering


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