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Demonstration of n-MOSFET operation and internal charge analysis of SiO2/Al2O3 gate dielectric on (111) oriented 3C-SiC

Research output: Contribution to conference › Paper › peer-review

Original languageEnglish
Pages777-778
Number of pages2
DOIs
Publication statusPublished - Sept 2019
Event2019 International Conference on Solid State Devices and Materials (SSDM2019) - Nagoya University, Nagoya, Japan
Duration: Sept 2 2019 → Sept 5 2019

Conference

Conference2019 International Conference on Solid State Devices and Materials (SSDM2019)
Country/TerritoryJapan
CityNagoya
Period9/2/19 → 9/5/19

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