Deflecting atoms through a submicron-sized slit with near-field light

Kazuhiro Yamamoto; Kouki Totsuka; Haruhiko Ito

doi:10.1007/s10043-006-0357-2

Deflecting atoms through a submicron-sized slit with near-field light

Kazuhiro Yamamoto, Kouki Totsuka, Haruhiko Ito

Research output: Contribution to journal › Article › peer-review

5 Citations (Scopus)

Abstract

We report experiments on deflecting cold ⁸⁷Rb atoms by repulsive near-field light induced in a 200-nm-wide slit. The spatial profile is measured with a two-step photoionization scan. The number of outputted atoms from the slit increases by the amount of 40 ± 7.2% at a 5.1 ± 2.0° angle for the blue detuning of +1 GHz. We discuss the spatial profile involving an image of the atomic cloud by means of the scattering cross section.

Original language	English
Pages (from-to)	357-360
Number of pages	4
Journal	Optical Review
Volume	13
Issue number	5
DOIs	https://doi.org/10.1007/s10043-006-0357-2
Publication status	Published - Sept 2006
Externally published	Yes

All Science Journal Classification (ASJC) codes

Atomic and Molecular Physics, and Optics

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10.1007/s10043-006-0357-2

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abstract = "We report experiments on deflecting cold 87Rb atoms by repulsive near-field light induced in a 200-nm-wide slit. The spatial profile is measured with a two-step photoionization scan. The number of outputted atoms from the slit increases by the amount of 40 ± 7.2% at a 5.1 ± 2.0° angle for the blue detuning of +1 GHz. We discuss the spatial profile involving an image of the atomic cloud by means of the scattering cross section.",

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year = "2006",

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AU - Yamamoto, Kazuhiro

AU - Totsuka, Kouki

AU - Ito, Haruhiko

PY - 2006/9

Y1 - 2006/9

N2 - We report experiments on deflecting cold 87Rb atoms by repulsive near-field light induced in a 200-nm-wide slit. The spatial profile is measured with a two-step photoionization scan. The number of outputted atoms from the slit increases by the amount of 40 ± 7.2% at a 5.1 ± 2.0° angle for the blue detuning of +1 GHz. We discuss the spatial profile involving an image of the atomic cloud by means of the scattering cross section.

AB - We report experiments on deflecting cold 87Rb atoms by repulsive near-field light induced in a 200-nm-wide slit. The spatial profile is measured with a two-step photoionization scan. The number of outputted atoms from the slit increases by the amount of 40 ± 7.2% at a 5.1 ± 2.0° angle for the blue detuning of +1 GHz. We discuss the spatial profile involving an image of the atomic cloud by means of the scattering cross section.

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EP - 360

JO - Optical Review

JF - Optical Review

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ER -

Deflecting atoms through a submicron-sized slit with near-field light

Abstract

All Science Journal Classification (ASJC) codes

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