Abstract
The low temperature defect chemistry is analyzed for ZrO2(Y2O3), SrZrO3(Y2O3), and SrTiO3. In this temperature regime, the oxygen incorporation is no longer in equilibrium but the internal ionization reaction of electrons (holes) with redox-active impurities is still reversible. The concentration of ions with a specific valence state is quantified by EPR for ZrO2(Y2O3), while the electrical conductivity is considered for SrZrO3(Y2O3) and SrTiO3. It is shown that the experimental low-temperature results can well be explained in this way. If the experiments are appropriately conducted, an additional degree of freedom is introduced, which is the freezing-in temperature. The technological and scientific relevance with respect to materials research is discussed.
Original language | English |
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Pages (from-to) | 51-60 |
Number of pages | 10 |
Journal | Solid State Ionics |
Volume | 121 |
Issue number | 1 |
DOIs | |
Publication status | Published - Jun 1999 |
Externally published | Yes |
Event | Proceedings of the 1997 11th International Conference on Solid State Ionics, SSI-97 - Honolulu, HI, USA Duration: Nov 16 1997 → Nov 21 1997 |
All Science Journal Classification (ASJC) codes
- Chemistry(all)
- Materials Science(all)
- Condensed Matter Physics