Crack tip dislocations revealed by electron tomography in silicon single crystal

Masaki Tanaka; Kenji Higashida; Kenji Kaneko; Satoshi Hata; Masatoshi Mitsuhara

doi:10.1016/j.scriptamat.2008.06.042

Crack tip dislocations revealed by electron tomography in silicon single crystal

Masaki Tanaka, Kenji Higashida, Kenji Kaneko, Satoshi Hata, Masatoshi Mitsuhara

Materials Physics and Engineering

Research output: Contribution to journal › Article › peer-review

74 Citations (Scopus)

Abstract

Crack tip dislocations in silicon single crystals have been observed by a combination of annular dark-field scanning transmission electron microscopy and computed tomography. A series of images was acquired by maintaining the diffraction vector parallel to that of crack propagation to achieve sharp images of the dislocations. The observed dislocations were reconstructed by a filtered back-projection, and exhibited three-dimensional configurations of overlaid dislocations around the crack tip.

Original language	English
Pages (from-to)	901-904
Number of pages	4
Journal	Scripta Materialia
Volume	59
Issue number	8
DOIs	https://doi.org/10.1016/j.scriptamat.2008.06.042
Publication status	Published - Oct 2008

All Science Journal Classification (ASJC) codes

Materials Science(all)
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering
Metals and Alloys

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10.1016/j.scriptamat.2008.06.042

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title = "Crack tip dislocations revealed by electron tomography in silicon single crystal",

abstract = "Crack tip dislocations in silicon single crystals have been observed by a combination of annular dark-field scanning transmission electron microscopy and computed tomography. A series of images was acquired by maintaining the diffraction vector parallel to that of crack propagation to achieve sharp images of the dislocations. The observed dislocations were reconstructed by a filtered back-projection, and exhibited three-dimensional configurations of overlaid dislocations around the crack tip.",

author = "Masaki Tanaka and Kenji Higashida and Kenji Kaneko and Satoshi Hata and Masatoshi Mitsuhara",

note = "Funding Information: The present work is partly supported by a Grant-in-Aid for Scientific Research (b) by The Ministry of Education, Culture, Sports, Science and Technology (KAKENHI#18360305), and The authors thank Mr. M. Honda for specimen preparation. ",

year = "2008",

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doi = "10.1016/j.scriptamat.2008.06.042",

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T1 - Crack tip dislocations revealed by electron tomography in silicon single crystal

AU - Tanaka, Masaki

AU - Higashida, Kenji

AU - Kaneko, Kenji

AU - Hata, Satoshi

AU - Mitsuhara, Masatoshi

N1 - Funding Information: The present work is partly supported by a Grant-in-Aid for Scientific Research (b) by The Ministry of Education, Culture, Sports, Science and Technology (KAKENHI#18360305), and The authors thank Mr. M. Honda for specimen preparation.

PY - 2008/10

Y1 - 2008/10

N2 - Crack tip dislocations in silicon single crystals have been observed by a combination of annular dark-field scanning transmission electron microscopy and computed tomography. A series of images was acquired by maintaining the diffraction vector parallel to that of crack propagation to achieve sharp images of the dislocations. The observed dislocations were reconstructed by a filtered back-projection, and exhibited three-dimensional configurations of overlaid dislocations around the crack tip.

AB - Crack tip dislocations in silicon single crystals have been observed by a combination of annular dark-field scanning transmission electron microscopy and computed tomography. A series of images was acquired by maintaining the diffraction vector parallel to that of crack propagation to achieve sharp images of the dislocations. The observed dislocations were reconstructed by a filtered back-projection, and exhibited three-dimensional configurations of overlaid dislocations around the crack tip.

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JO - Scripta Materialia

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Crack tip dislocations revealed by electron tomography in silicon single crystal

Abstract

All Science Journal Classification (ASJC) codes

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